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Volume 39; Issue 6
Main
Micron
Volume 39; Issue 6
Micron
Volume 39; Issue 6
1
Comparison of NEXAFS microscopy and TEM-EELS for studies of soft matter
Adam P. Hitchcock
,
James J. Dynes
,
Göran Johansson
,
Jian Wang
,
Gianluigi Botton
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 1.70 MB
Your tags:
english, 2008
2
Decisive factors for realizing atomic-column resolution using STEM and EELS
Koji Kimoto
,
Kazuo Ishizuka
,
Yoshio Matsui
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 581 KB
Your tags:
english, 2008
3
Preface
Marek Malac
,
Yimei Zhu
,
Gianluigi Botton
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 171 KB
Your tags:
english, 2008
4
Local crystal anisotropy obtained in the small probe geometry
Philip E. Batson
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 392 KB
Your tags:
english, 2008
5
Development of electron energy-loss spectroscopy for nanoscience
Jun Yuan
,
Zhiwei Wang
,
Xin Fu
,
Lin Xie
,
Yuekui Sun
,
Shangpeng Gao
,
Jun Jiang
,
Xuerang Hu
,
Chen Xu
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 825 KB
Your tags:
english, 2008
6
Comparison of the electronic structure of a thermoelectric skutterudite before and after adding rattlers: An electron energy loss study
Ø. Prytz
,
R. Sæterli
,
O.M. Løvvik
,
J. Taftø
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 350 KB
Your tags:
english, 2008
7
Observation of long-range compositional fluctuations in glasses: Implications for atomic and electronic structure
Nan Jiang
,
Jianrong Qiu
,
C.J. Humphreys
,
John C.H. Spence
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 458 KB
Your tags:
english, 2008
8
Nanomaterial electronic structure investigation by valence electron energy loss spectroscopy—An example of doped ZnO nanowires
Juan Wang
,
Quan Li
,
C. Ronning
,
D. Stichtenoth
,
S. Müller
,
D. Tang
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 502 KB
Your tags:
english, 2008
9
Quantitative electron energy-loss spectroscopy (EELS) analyses of lead zirconate titanate
P. Harkins
,
M. MacKenzie
,
A.J. Craven
,
D.W. McComb
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 1.02 MB
Your tags:
english, 2008
10
High-resolution Z-contrast imaging and EELS study of functional oxide materials
Robert F. Klie
,
Yuan Zhao
,
Guang Yang
,
Yimei Zhu
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 1.70 MB
Your tags:
english, 2008
11
Dose-limited spectroscopic imaging of soft materials by low-loss EELS in the scanning transmission electron microscope
Sergey Yakovlev
,
Matthew Libera
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 596 KB
Your tags:
english, 2008
12
Image simulation for electron energy loss spectroscopy
M.P. Oxley
,
S.J. Pennycook
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 1.55 MB
Your tags:
english, 2008
13
Study of mean absorptive potential using Lenz model: Toward quantification of phase contrast from an electrostatic phase plate
Ko-Feng Chen
,
Chia-Seng Chang
,
Jessie Shiue
,
Yeukuang Hwu
,
Wei-Hau Chang
,
Ji-Jung Kai
,
Fu-Rong Chen
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 677 KB
Your tags:
english, 2008
14
Editorial Board
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 39 KB
Your tags:
english, 2008
15
Fourier-ratio deconvolution and its Bayesian equivalent
R.F. Egerton
,
F. Wang
,
M. Malac
,
M.S. Moreno
,
F. Hofer
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 242 KB
Your tags:
english, 2008
16
Omega filter installed in the 1 MV microscope of Kyushu University
K. Omoto
,
K. Tsuno
,
M. Ohsaki
,
S. Matsumura
,
Y. Tomokiyo
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 2.06 MB
Your tags:
english, 2008
17
Electron energy loss near edge structure (ELNES) spectra of AlN and AlGaN: A theoretical study using the Wien2k and Telnes programs
D. Holec
,
P.M.F.J. Costa
,
P.D. Cherns
,
C.J. Humphreys
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 643 KB
Your tags:
english, 2008
18
Investigation of the oxide shell forming on ɛ-Co nanocrystals
N. Braidy
,
S. Behal
,
A. Adronov
,
G.A. Botton
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 817 KB
Your tags:
english, 2008
19
Publisher's note
Journal:
Micron
Year:
2008
Language:
english
File:
PDF, 66 KB
Your tags:
english, 2008
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