Volume 1; Issue 6

Microscopy and Microanalysis

Volume 1; Issue 6

1

Structures of a Stacking Fault and a Rotational Domain Boundary in CVD [alpha]-Silicon Nitride

Zhou, D.S., Mitchell, T.E.

Journal:

Microscopy and Microanalysis

Year:

1995

File:

PDF, 5.26 MB

1995

2

Design and Initial Performance of an Ultrahigh Vacuum Sample Preparation Evaluation Analysis and Reaction (SPEAR) System

Collazo-Davila, C., Landree, E., Grozea, D., Jayaram, G., Plass, R., Stair, P.C., Marks, L.D.

Journal:

Microscopy and Microanalysis

Year:

1995

File:

PDF, 4.55 MB

1995

3

Z-Contrast Imaging in the Scanning Transmission Electron Microscope

Pennycook, S.J., Jesson, D.E., Chisholm, M.F., Browning, N.D., McGibbon, A.J., McGibbon, M.M.

Journal:

Microscopy and Microanalysis

Year:

1995

File:

PDF, 12.67 MB

1995

4

Tunable Label Contrast on the Cell Surface: Photoelectron Imaging with Multiple Wavelength Excitation

Hedberg, Karen K., Birrell, G. Bruce, Habliston, Douglas L., Griffith, O. Hayes

Journal:

Microscopy and Microanalysis

Year:

1995

File:

PDF, 4.62 MB

1995