Volume 10; Issue 6

Microscopy and Microanalysis

Volume 10; Issue 6

1

Experimental Characterization and Mitigation of Specimen Charging on Thin Films with One Conducting Layer

Downing, Kenneth H., McCartney, M.R., Glaeser, Robert M.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 303 KB

english, 2004

2

Charge Implantation Measurement on Electron-Irradiated Insulating Materials by Means of a SEM Technique

Jbara, Omar, Fakhfakh, Slim, Belhaj, Mohamed, Rondot, Sebastien

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 312 KB

english, 2004

3

About the Mechanisms of Charging in EPMA, SEM, and ESEM with Their Time Evolution

Cazaux, Jacques

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 260 KB

english, 2004

4

Static and Dynamic Charges: Changing Perspectives and Aims in Electron Microscopy

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 208 KB

english, 2004

5

Charge Neutralization in the ESEM for Quantitative X-ray Microanalysis

Carlton, Robert A., Lyman, Charles E., Roberts, James E.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 192 KB

english, 2004

6

Introduction: Characterization of Nonconductive Materials

Gauvin, Raynald

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 33 KB

english, 2004

7

Quantitative Electron Probe Microanalysis of Nonconducting Specimens: Science or Art?

Bastin, Guillaume F., Heijligers, Hans J.M.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 179 KB

english, 2004

8

X-ray Microanalysis of a Coated Nonconductive Specimen: Monte Carlo Simulation

Demers, Hendrix, Gauvin, Raynald

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 157 KB

english, 2004

9

Charge Trapping in Dielectrics

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 173 KB

english, 2004

10

Calendar of Meetings and Courses

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 55 KB

english, 2004

11

Kelvin Probe Microscopy of Localized Electric Potentials Induced in Insulating Materials by Electron Irradiation

Stevens-Kalceff, Marion A.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 138 KB

english, 2004

12

Charge Contrast Imaging of Gibbsite Using the Variable Pressure SEM

Robertson, Kevin, Gauvin, Raynald, Finch, James

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 726 KB

english, 2004

13

Charging Processes in Low Vacuum Scanning Electron Microscopy

Thiel, Bradley L., Toth, Milos, Craven, John P.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 302 KB

english, 2004

14

Specimen Charging on Thin Films with One Conducting Layer: Discussion of Physical Principles

Glaeser, Robert M., Downing, Kenneth H.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 130 KB

english, 2004

15

Microanalysis of Porous Materials

Sorbier, Loïc, Rosenberg, Elisabeth, Merlet, Claude

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 275 KB

english, 2004

16

Assessing Charging Effects on Spectral Quality for X-ray Microanalysis in Low Voltage and Variable Pressure/Environmental Scanning Electron Microscopy

Newbury, Dale E.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 263 KB

english, 2004

17

The Impact of Charging on Low-Energy Electron Beam Lithography

Mun, Lau Kien, Drouin, Dominique, Lavallée, Eric, Beauvais, Jacques

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 365 KB

english, 2004

18

Mask Charging Phenomena during Electron Beam Exposure in the EPL System

Kotera, Masatoshi, Ishida, Yoshihisa

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 247 KB

english, 2004

19

Monte Carlo Modeling of Electron Scattering in Nonconductive Specimens

Fitting, H.-J., Schreiber, E., Glavatskikh, I.A.

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 350 KB

english, 2004