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Volume 10; Issue 6
Main
Microscopy and Microanalysis
Volume 10; Issue 6
Microscopy and Microanalysis
Volume 10; Issue 6
1
Experimental Characterization and Mitigation of Specimen Charging on Thin Films with One Conducting Layer
Downing, Kenneth H.
,
McCartney, M.R.
,
Glaeser, Robert M.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 303 KB
Your tags:
english, 2004
2
Charge Implantation Measurement on Electron-Irradiated Insulating Materials by Means of a SEM Technique
Jbara, Omar
,
Fakhfakh, Slim
,
Belhaj, Mohamed
,
Rondot, Sebastien
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 312 KB
Your tags:
english, 2004
3
About the Mechanisms of Charging in EPMA, SEM, and ESEM with Their Time Evolution
Cazaux, Jacques
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 260 KB
Your tags:
english, 2004
4
Static and Dynamic Charges: Changing Perspectives and Aims in Electron Microscopy
Howie, Archie
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 208 KB
Your tags:
english, 2004
5
Charge Neutralization in the ESEM for Quantitative X-ray Microanalysis
Carlton, Robert A.
,
Lyman, Charles E.
,
Roberts, James E.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 192 KB
Your tags:
english, 2004
6
Introduction: Characterization of Nonconductive Materials
Gauvin, Raynald
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 33 KB
Your tags:
english, 2004
7
Quantitative Electron Probe Microanalysis of Nonconducting Specimens: Science or Art?
Bastin, Guillaume F.
,
Heijligers, Hans J.M.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 179 KB
Your tags:
english, 2004
8
X-ray Microanalysis of a Coated Nonconductive Specimen: Monte Carlo Simulation
Demers, Hendrix
,
Gauvin, Raynald
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 157 KB
Your tags:
english, 2004
9
Charge Trapping in Dielectrics
Bonnelle, C.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 173 KB
Your tags:
english, 2004
10
Calendar of Meetings and Courses
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 55 KB
Your tags:
english, 2004
11
Kelvin Probe Microscopy of Localized Electric Potentials Induced in Insulating Materials by Electron Irradiation
Stevens-Kalceff, Marion A.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 138 KB
Your tags:
english, 2004
12
Charge Contrast Imaging of Gibbsite Using the Variable Pressure SEM
Robertson, Kevin
,
Gauvin, Raynald
,
Finch, James
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 726 KB
Your tags:
english, 2004
13
Charging Processes in Low Vacuum Scanning Electron Microscopy
Thiel, Bradley L.
,
Toth, Milos
,
Craven, John P.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 302 KB
Your tags:
english, 2004
14
Specimen Charging on Thin Films with One Conducting Layer: Discussion of Physical Principles
Glaeser, Robert M.
,
Downing, Kenneth H.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 130 KB
Your tags:
english, 2004
15
Microanalysis of Porous Materials
Sorbier, Loïc
,
Rosenberg, Elisabeth
,
Merlet, Claude
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 275 KB
Your tags:
english, 2004
16
Assessing Charging Effects on Spectral Quality for X-ray Microanalysis in Low Voltage and Variable Pressure/Environmental Scanning Electron Microscopy
Newbury, Dale E.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 263 KB
Your tags:
english, 2004
17
The Impact of Charging on Low-Energy Electron Beam Lithography
Mun, Lau Kien
,
Drouin, Dominique
,
Lavallée, Eric
,
Beauvais, Jacques
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 365 KB
Your tags:
english, 2004
18
Mask Charging Phenomena during Electron Beam Exposure in the EPL System
Kotera, Masatoshi
,
Ishida, Yoshihisa
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 247 KB
Your tags:
english, 2004
19
Monte Carlo Modeling of Electron Scattering in Nonconductive Specimens
Fitting, H.-J.
,
Schreiber, E.
,
Glavatskikh, I.A.
Journal:
Microscopy and Microanalysis
Year:
2004
Language:
english
File:
PDF, 350 KB
Your tags:
english, 2004
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