Volume 9; Issue 6

Microscopy and Microanalysis

Volume 9; Issue 6

1

Thin Dielectric Film Thickness Determination by Advanced Transmission Electron Microscopy

Diebold, A.C., Foran, B., Kisielowski, C., Muller, D.A., Pennycook, S.J., Principe, E., Stemmer, S.

Journal:

Microscopy and Microanalysis

Year:

2003

Language:

english

File:

PDF, 11.23 MB

english, 2003

2

Extending Energy-Filtered Transmission Electron Microscopy (EFTEM) into Three Dimensions Using Electron Tomography

Weyland, Matthew, Midgley, Paul A.

Journal:

Microscopy and Microanalysis

Year:

2003

Language:

english

File:

PDF, 620 KB

english, 2003

3

The Use of High Pressure Freezing and Freeze Substitution to Study Host–Pathogen Interactions in Fungal Diseases of Plants

Mims, C.W., Celio, Gail J., Richardson, Elizabeth A.

Journal:

Microscopy and Microanalysis

Year:

2003

Language:

english

File:

PDF, 1.61 MB

english, 2003

4

Selected-Area Growth of Carbon Nanotubes by the Combination of Focused Ion Beam and Chemical Vapor Deposition Techniques

Jiao, Jun, Dong, Lifeng, Foxley, Sean, Mosher, Catherine L., Tuggle, David W.

Journal:

Microscopy and Microanalysis

Year:

2003

Language:

english

File:

PDF, 350 KB

english, 2003

5

Analysis of Orientations of Collagen Fibers by Novel Fiber-Tracking Software

Wu, Jun, Rajwa, Bartlomiej, Filmer, David L., Hoffmann, Christoph M., Yuan, Bo, Chiang, Ching-Shoei, Sturgis, Jennie, Robinson, J. Paul

Journal:

Microscopy and Microanalysis

Year:

2003

Language:

english

File:

PDF, 209 KB

english, 2003

6

Angioarchitecture of Tumors Induced by Two Different Cloned Cell Lines Established from a Transplantable Rat Malignant Fibrous Histiocytoma

Tsunenari, Ichiro, Yamate, Jyoji, Iwaki, Masae, Kuwamura, Mitsuru, Kotani, Takao, Sakuma, Sadashige

Journal:

Microscopy and Microanalysis

Year:

2003

Language:

english

File:

PDF, 1.68 MB

english, 2003

7

Electron Beam Coater for Reduction of Charging in Ice-Embedded Biological Specimens using Ti88Si12 Alloy

Sherman, Michael B., Chiu, Wah

Journal:

Microscopy and Microanalysis

Year:

2003

Language:

english

File:

PDF, 923 KB

english, 2003

8

Using Fluctuation Microscopy to Characterize Structural Order in Metallic Glasses

Li, Jing, Gu, X., Hufnagel, T.C.

Journal:

Microscopy and Microanalysis

Year:

2003

Language:

english

File:

PDF, 307 KB

english, 2003

9

Object Oriented Database and Electronic Notebook for Transmission Electron Microscopy

Ludtke, Steven J., Nason, Laurie, Tu, Haili, Peng, Liwei, Chiu, Wah

Journal:

Microscopy and Microanalysis

Year:

2003

Language:

english

File:

PDF, 961 KB

english, 2003

10

Letter to the Editor: Comments on “Compositional Averaging of Backscatter Intensities in Compounds,” with a Response from Donovan

Journal:

Microscopy and Microanalysis

Year:

2003

Language:

english

File:

PDF, 149 KB

english, 2003

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