Volume 38; Issue 28

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Applied Optics
Volume 38; Issue 28

Applied Optics

Volume 38; Issue 28

1

Patents

Journal:

Year:

1999

Language:

english

File:

PDF, 72 KB

english, 1999

2

Interference Effects in Far-Field Diffractive Optical Elements

Waddie, Andrew J., Taghizadeh, Mohammad R.

Journal:

Year:

1999

Language:

english

File:

PDF, 858 KB

english, 1999

3

Characterization of Diffraction Gratings in a Rigorous Domain with Optical Scatterometry: Hierarchical Neural-Network Model

Kallioniemi, Ilkka, Saarinen, Jyrki, Oja, Erkki

Journal:

Year:

1999

Language:

english

File:

PDF, 166 KB

english, 1999

4

Phase-Shifting Method with a Normal Polariscope

Asundi, Anand, Tong, Liu, Boay, Chai Gin

Journal:

Year:

1999

Language:

english

File:

PDF, 2.11 MB

english, 1999

5

Sensor Performance Conversions for Infrared Target Acquisition and Intelligence-Surveillance- Reconnaissance Imaging Sensors

Driggers, Ronald G., Kruer, Mel, Scribner, Dean, Warren, Penny, Leachtenauer, Jon

Journal:

Year:

1999

Language:

english

File:

PDF, 855 KB

english, 1999

6

Transient Deformation Measurement with Electronic Speckle Pattern Interferometry by Use of a Holographic Optical Element for Spatial Phase Stepping

García, Bernardino Barrientos, Moore, Andrew J., Pérez-López, Carlos, Wang, Lingli, Tschudi, Theo

Journal:

Year:

1999

Language:

english

File:

PDF, 186 KB

english, 1999

7

Corrosion Monitoring with Speckle Correlation

Fricke-Begemann, Thomas, Gülker, Gerd, Hinsch, Klaus D., Wolff, Karen

Journal:

Year:

1999

Language:

english

File:

PDF, 256 KB

english, 1999

8

Dynamic Measurements of Internal Three-Dimensional Displacement Fields with Digital Speckle Photography and Flash X rays

Synnergren, Per, Goldrein, H. Timothy

Journal:

Year:

1999

Language:

english

File:

PDF, 6.29 MB

english, 1999

9

Telecentric Three-Dimensional Sensor with a Liquid Mirror for Large-Object Inspection

Thibault, Simon, Borra, Ermanno F.

Journal:

Year:

1999

Language:

english

File:

PDF, 245 KB

english, 1999

10

Thickness-Profile Measurement of Transparent Thin-Film Layers by White-Light Scanning Interferometry

Kim, Seung-Woo, Kim, Gee-Hong

Journal:

Year:

1999

Language:

english

File:

PDF, 573 KB

english, 1999

11

Low-Coherence Interferometry with Synthesis of Coherence Function

Teramura, Yuichi, Suzuki, Keiichi, Suzuki, Masayuki, Kannari, Fumihiko

Journal:

Year:

1999

Language:

english

File:

PDF, 277 KB

english, 1999

12

Absolute Interferometry with a 670-nm External Cavity Diode Laser

Stone, Jack A., Stejskal, Alois, Howard, Lowell

Journal:

Year:

1999

Language:

english

File:

PDF, 159 KB

english, 1999

13

Imaging Properties in Two-Photon Excitation Microscopy and Effects of Refractive-Index Mismatch in Thick Specimens

de Grauw, Cees J., Vroom, Jurrien M., van der Voort, Hans T. M, Gerritsen, Hans C.

Journal:

Year:

1999

Language:

english

File:

PDF, 1.22 MB

english, 1999

14

High-Speed, Two-Photon Scanning Microscope

Kim, Ki Hean, Buehler, Christof, So, Peter T. C.

Journal:

Year:

1999

Language:

english

File:

PDF, 1.37 MB

english, 1999

15

Design of a Diluted Aperture by Use of the Practical Cutoff Frequency

Flores, Jorge L., Paez, Gonzalo, Strojnik, Marija

Journal:

Year:

1999

Language:

english

File:

PDF, 221 KB

english, 1999

16

Wave-front generation of Zernike polynomial modes with a micromachined membrane deformable mirror

Zhu, Lijun, Sun, Pang-Chen, Bartsch, Dirk-Uwe, Freeman, William R., Fainman, Yeshaiahu

Journal:

Year:

1999

Language:

english

File:

PDF, 461 KB

english, 1999

17

Rayleigh Scattering Limits for Low-Level Bidirectional Reflectance Distribution Function Measurements: Corrigendum

Asmail, Clara C., Parr, Albert C., Hsia, Jack J.

Journal:

Year:

1999

Language:

english

File:

PDF, 49 KB

english, 1999

18

Influence of Surface Roughness on the Calculation of Optical Constants of a Metallic Film by Attenuated Total Reflection

Lee, Cheng-Chung, Jen, Yi-Jun

Journal:

Year:

1999

Language:

english

File:

PDF, 450 KB

english, 1999

19

Dependence of the Reflectance of a Multilayer Reflector on the Thickness of the Outer Layer

Baumeister, Philip

Journal:

Year:

1999

Language:

english

File:

PDF, 51 KB

english, 1999

20

Sensitivity Enhancement of Integrated Optical Sensors by Use of Thin High-Index Films

Quigley, Geoffrey R., Harris, Richard D., Wilkinson, James S.

Journal:

Year:

1999

Language:

english

File:

PDF, 75 KB

english, 1999

21

Compensation of Optical Path Lengths in Extreme-Ultraviolet and Soft-X-Ray Monochromators for Ultrafast Pulses

Villoresi, Paolo

Journal:

Year:

1999

Language:

english

File:

PDF, 183 KB

english, 1999

22

n-Hindle-Sphere Arrangement with an Exact Ray Trace for Testing Hyperboloid Convex Mirrors

Percino-Zacarias, María E., Cordero-Dávila, Alberto

Journal:

Year:

1999

Language:

english

File:

PDF, 587 KB

english, 1999

23

Effect of Telescope Alignment on a Stellar Interferometer

Porro, Irene L., Traub, Wesley A., Carleton, Nathaniel P.

Journal:

Year:

1999

Language:

english

File:

PDF, 243 KB

english, 1999

24

MicroInstrument Gradient-Force Optical Trap

Collins, Scott D., Baskin, Ronald J., Howitt, David G.

Journal:

Year:

1999

Language:

english

File:

PDF, 1.02 MB

english, 1999

25

Hybrid Monte Carlo for Photon Transport through Optically Thick Scattering Media

Chatigny, Stéphane, Morin, Michel, Asselin, Daniel, Painchaud, Yves, Beaudry, Pierre

Journal:

Year:

1999

Language:

english

File:

PDF, 175 KB

english, 1999

26

Investigation of the Laserlike Behavior of Polymeric Scattering Gain Media Under Subpicosecond Laser Excitation

Zacharakis, Giannis, Heliotis, George, Filippidis, George, Anglos, Demetrios, Papazoglou, Theodore G.

Journal:

Year:

1999

Language:

english

File:

PDF, 255 KB

english, 1999

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