Volume 39; Issue 13

Applied Optics

Volume 39; Issue 13
3

Model for Quantifying Photoelastic Fringe Degradation by Imperfect Retroreflective Backings

Year:
2000
Language:
english
File:
PDF, 1.35 MB
english, 2000
5

Method for Measuring Veiling Glare in High-Performance Display Devices

Year:
2000
Language:
english
File:
PDF, 304 KB
english, 2000
6

Optical Plastic Refractive Measurements in the Visible and the Near-Infrared Regions

Year:
2000
Language:
english
File:
PDF, 74 KB
english, 2000
8

Phase Retardometer: A Proposed Device for Measuring Phase Retardance

Year:
2000
Language:
english
File:
PDF, 58 KB
english, 2000
10

Effects of Unparallel Grating Planes in Talbot Interferometry. II

Year:
2000
Language:
english
File:
PDF, 392 KB
english, 2000
12

Fringe Modulation Skewing Effect in White-Light Vertical Scanning Interferometry

Year:
2000
Language:
english
File:
PDF, 216 KB
english, 2000
13

Improved Vertical-Scanning Interferometry

Year:
2000
Language:
english
File:
PDF, 619 KB
english, 2000
15

Interference Imaging for Aspheric Surface Testing

Year:
2000
Language:
english
File:
PDF, 839 KB
english, 2000
19

Variation on Zernike’s phase-contrast microscope

Year:
2000
Language:
english
File:
PDF, 2.11 MB
english, 2000
23

Chemical Cleaving Method of Relief Microstructure Formation on Dichromated Gelatin

Year:
2000
Language:
english
File:
PDF, 757 KB
english, 2000
24

Design of multilayer extreme-ultraviolet mirrors for enhanced reflectivity

Year:
2000
Language:
english
File:
PDF, 138 KB
english, 2000