Volume 40; Issue 28

Applied Optics

Volume 40; Issue 28
2

Depolarization and Principal Mueller Matrix Measured by Null Ellipsometry

Year:
2001
Language:
english
File:
PDF, 116 KB
english, 2001
6

High-Numerical-Aperture Scalar Imaging

Year:
2001
Language:
english
File:
PDF, 103 KB
english, 2001
9

Far-Infrared Fizeau Interferometry

Year:
2001
Language:
english
File:
PDF, 1.34 MB
english, 2001
14

Bicorn Filters with Strong and Broad Rejection for Single-Mode Waveguides

Year:
2001
Language:
english
File:
PDF, 112 KB
english, 2001
18

Precise and Simple Optical Alignment Method for Double-Sided Lithography

Year:
2001
Language:
english
File:
PDF, 911 KB
english, 2001
19

Making an Omnidirectional Reflector

Year:
2001
Language:
english
File:
PDF, 165 KB
english, 2001
20

Light Scattering by Wood Fibers

Year:
2001
Language:
english
File:
PDF, 586 KB
english, 2001
25

Measuring the Refractive Index of Thin Liquid Films with a Spectrometer

Year:
2001
Language:
english
File:
PDF, 75 KB
english, 2001