Volume 32; Issue 7

Applied Physics Letters

Volume 32; Issue 7
2

A high-resolution electron microscopy study of the Si-SiO2 interface

Krivanek, O. L., Sheng, T. T., Tsui, D. C.
Journal:
Applied Physics Letters
Year:
1978
Language:
english
File:
PDF, 480 KB
english, 1978
8

Low pressure rf annealing: A new technique to remove charge centers in MIS dielectrics

Ma, T-P., Ma, W. H-L.
Journal:
Applied Physics Letters
Year:
1978
Language:
english
File:
PDF, 612 KB
english, 1978
9

Collisionless production of C2(a3πu) in an intense infrared laser field

Campbell, J. D., Yu, M. H., Wittig, C.
Journal:
Applied Physics Letters
Year:
1978
Language:
english
File:
PDF, 446 KB
english, 1978
10

Instabilities in thin tunnel junctions

Konkin, M. K., Adler, J. G.
Journal:
Applied Physics Letters
Year:
1978
Language:
english
File:
PDF, 329 KB
english, 1978
12

Laser modulation of electroluminescence in thin-film ZnS : Mn devices

Chang, I. F., Yu, P. Y.
Journal:
Applied Physics Letters
Year:
1978
Language:
english
File:
PDF, 326 KB
english, 1978
13

BOXCARS: Crossed-beam phase-matched CARS generation in gases

Eckbreth, Alan C.
Journal:
Applied Physics Letters
Year:
1978
Language:
english
File:
PDF, 406 KB
english, 1978
14

An InGaAs detector for the 1.0–1.7-μm wavelength range

Bachmann, K. J., Shay, J. L.
Journal:
Applied Physics Letters
Year:
1978
Language:
english
File:
PDF, 383 KB
english, 1978
17

Nonequilibrium response of MOS devices to linearly varying voltages

Nassibian, A. G., Faraone, L., Simmons, J. G.
Journal:
Applied Physics Letters
Year:
1978
Language:
english
File:
PDF, 421 KB
english, 1978
18

Scattering of light from Rayleigh waves

Sung, C. C.
Journal:
Applied Physics Letters
Year:
1978
Language:
english
File:
PDF, 341 KB
english, 1978
19

Hydrogenation and dehydrogenation of amorphous and crystalline silicon

Pankove, J. I., Lampert, M. A., Tarng, M. L.
Journal:
Applied Physics Letters
Year:
1978
Language:
english
File:
PDF, 452 KB
english, 1978