Volume 36; Issue 12

Applied Physics Letters

Volume 36; Issue 12
4

Semiconducting properties of amorphous V2O5 layers deposited from gels

Bullot, J., Gallais, O., Gauthier, M., Livage, J.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 586 KB
english, 1980
5

Improved characterization of the Si-SiO2 interface

Su, P., Sher, A., Tsuo, Y. H., Moriarty, J. A., Miller, W. E.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 500 KB
english, 1980
6

Lifetime extension of XeCl and KrCl lasers with additives

McKee, T. J., James, D. J., Nip, W. S., Weeks, R. W., Willis, C.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 493 KB
english, 1980
7

Effect of neutron irradiation on the pulse dispersion in a step-index optical fiber

Rao, R., Mitra, S. S.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 452 KB
english, 1980
8

Electro-optic frequency- and polarization-modulated injection laser

Reinhart, F. K., Logan, R. A.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 531 KB
english, 1980
9

Optical emission from Ga ionization at a field emitter

Kuk, Young, Sakurai, T., Culbertson, R. J., Robertson, G. H.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 407 KB
english, 1980
11

Photoionization cross section and density of interface states in MOS structures

Greve, D. W., Dahlke, W. E.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 437 KB
english, 1980
12

Theoretical model of an optoacoustic detector

Gupta, Jitendra P., Sachdev, Rajendra N.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 423 KB
english, 1980
13

A Josephson ultrahigh-resolution sampling system

Tuckerman, David B.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 492 KB
english, 1980
14

Raman spectroscopy of surface oxides at elevated temperatures

Farrow, R. L., Nagelberg, A. S.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 503 KB
english, 1980
15

Photoacoustic microscopy of an integrated circuit

Favro, L. D., Kuo, P. K., Pouch, J. J., Thomas, R. L.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 331 KB
english, 1980
16

Anomalous stress in thermal oxide of polycrystalline Si

Shintani, A., Nakashima, H.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 402 KB
english, 1980
17

Dislocation motion and solid-state turbulence

Herring, C., Huberman, B. A.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 382 KB
english, 1980
18

Low-temperature epitaxial regrowth of ion-implanted amorphous GaAs

Williams, J. S., Austin, M. W.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 424 KB
english, 1980
19

Computer modelling study of ablative optical recording

Cohen, M. S.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 400 KB
english, 1980
20

Oxidized amorphous-silicon superconducting tunnel junction barriers

Rudman, D. A, Beasley, M. R.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 478 KB
english, 1980
21

Erratum: Debye screening modifications in ponderomotive effects

Sodha, M. S., Subbarao, D.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 212 KB
english, 1980
23

Fluorine-enhanced plasma growth of native layers on silicon

Chang, R. P. H., Chang, C. C., Darack, S.
Journal:
Applied Physics Letters
Year:
1980
Language:
english
File:
PDF, 512 KB
english, 1980