Volume 57; Issue 11

Applied Physics Letters

Volume 57; Issue 11
3

Role of copper in electromigration lifetimes of aluminum alloy conductors

Year:
1990
Language:
english
File:
PDF, 464 KB
english, 1990
5

Optical measurement of electron bunching in vacuum

Year:
1990
Language:
english
File:
PDF, 596 KB
english, 1990
7

Hydrogen annealing of PtSi-Si Schottky barrier contacts

Year:
1990
Language:
english
File:
PDF, 628 KB
english, 1990
13

Digital chemical vapor deposition of SiO2

Year:
1990
Language:
english
File:
PDF, 537 KB
english, 1990
15

Ultrafast coplanar air-transmission lines

Year:
1990
Language:
english
File:
PDF, 612 KB
english, 1990
16

Raman examination of a plasma arcjet deposited diamond film

Year:
1990
Language:
english
File:
PDF, 469 KB
english, 1990
18

Heterostructure p-n junction tunnel diodes

Year:
1990
Language:
english
File:
PDF, 442 KB
english, 1990