Volume 60; Issue 26

Applied Physics Letters

Volume 60; Issue 26
4

Microluminescence depth profiles and annealing effects in porous silicon

Year:
1992
Language:
english
File:
PDF, 520 KB
english, 1992
5

High speed, nondestructive readout from thin-film ferroelectric memory

Year:
1992
Language:
english
File:
PDF, 566 KB
english, 1992
10

Selection of solutes for improving electromigration resistance of metals: A new insight

Year:
1992
Language:
english
File:
PDF, 648 KB
english, 1992
16

Metal-oxide-semiconductor characteristics of chemical vapor deposited Ta2O5 films

Year:
1992
Language:
english
File:
PDF, 639 KB
english, 1992
26

Charged dangling bonds in undoped amorphous silicon

Year:
1992
Language:
english
File:
PDF, 616 KB
english, 1992
34

Growth mode and dislocation distribution in the ZnSe/GaAs (100) system

Year:
1992
Language:
english
File:
PDF, 803 KB
english, 1992