Volume 62; Issue 7

Applied Physics Letters

Volume 62; Issue 7
1

Residual strains in epitaxial fluorides on Si(111) substrates

Year:
1993
Language:
english
File:
PDF, 653 KB
english, 1993
4

Dislocations and strain relief in compositionally graded layers

Year:
1993
Language:
english
File:
PDF, 524 KB
english, 1993
5

Electrical characteristics of directly-bonded GaAs and InP

Year:
1993
Language:
english
File:
PDF, 660 KB
english, 1993
15

Infrared reflectance of thin aluminum nitride films on various substrates

Year:
1993
Language:
english
File:
PDF, 609 KB
english, 1993
17

Residual critical current in high Tc bicrystal grain boundary junctions

Year:
1993
Language:
english
File:
PDF, 592 KB
english, 1993
22

Electron velocity distribution function in a gas in E×B fields

Year:
1993
Language:
english
File:
PDF, 535 KB
english, 1993
25

X-ray diffraction method for characterization of thin surface layers and thin epitaxial films

Year:
1993
Language:
english
File:
PDF, 505 KB
english, 1993
31

Transport properties of indium tin oxide/p-InP structures

Year:
1993
Language:
english
File:
PDF, 574 KB
english, 1993
32

Negative and positive ions from CF4 and CF4/O2 rf discharges in etching Si

Year:
1993
Language:
english
File:
PDF, 592 KB
english, 1993