Volume 71; Issue 22

Applied Physics Letters

Volume 71; Issue 22
5

Ultimate limit for defect generation in ultra-thin silicon dioxide

Year:
1997
Language:
english
File:
PDF, 266 KB
english, 1997
15

Dielectric properties of lithium triborate single crystals

Year:
1997
Language:
english
File:
PDF, 331 KB
english, 1997
17

Improved spatial resolution in magnetic force microscopy

Year:
1997
Language:
english
File:
PDF, 760 KB
english, 1997
18

1/f dielectric polarization noise in silicon p-n junctions

Year:
1997
Language:
english
File:
PDF, 327 KB
english, 1997
21

Polarization threshold switches based on ordered GaInP

Year:
1997
Language:
english
File:
PDF, 276 KB
english, 1997
22

Charging of substrates irradiated by particle beams

Year:
1997
Language:
english
File:
PDF, 265 KB
english, 1997
25

Magnetic tunnel junctions with in situ naturally-oxidized tunnel barrier

Year:
1997
Language:
english
File:
PDF, 238 KB
english, 1997