Volume 75; Issue 25

Applied Physics Letters

Volume 75; Issue 25
1

Tantalum carbide ohmic contacts to n-type silicon carbide

Year:
1999
Language:
english
File:
PDF, 330 KB
english, 1999
3

WS[sub 2] nanotubes as tips in scanning probe microscopy

Year:
1999
Language:
english
File:
PDF, 653 KB
english, 1999
14

Phase jumps and interferometric surface plasmon resonance imaging

Year:
1999
Language:
english
File:
PDF, 447 KB
english, 1999
20

Defect-related local-electric-field impact on p–n junction parameters

Year:
1999
Language:
english
File:
PDF, 297 KB
english, 1999
25

Ohmic contact to p-type GaAs using Cu[sub 3]Ge

Year:
1999
Language:
english
File:
PDF, 347 KB
english, 1999
31

Shear piezoelectric coefficients of gallium nitride and aluminum nitride

Year:
1999
Language:
english
File:
PDF, 303 KB
english, 1999
33

Detection of Cr impurities in GaN by room temperature cathodoluminescence spectroscopy

Year:
1999
Language:
english
File:
PDF, 373 KB
english, 1999
34

Room-temperature electroluminescence from erbium-doped porous silicon

Year:
1999
Language:
english
File:
PDF, 237 KB
english, 1999