Volume 77; Issue 14

Applied Physics Letters

Volume 77; Issue 14
3

X-ray diffraction analysis of the defect structure in epitaxial GaN

Year:
2000
Language:
english
File:
PDF, 52 KB
english, 2000
13

Investigating the growth of localized defects in thin films using gold nanospheres

Year:
2000
Language:
english
File:
PDF, 474 KB
english, 2000
16

Elastic constants of cubic boron nitride films

Year:
2000
Language:
english
File:
PDF, 294 KB
english, 2000
23

Generation of atmospheric pressure plasma with a dual-chamber discharge

Year:
2000
Language:
english
File:
PDF, 513 KB
english, 2000
28

Lattice location of implanted Cu in highly doped Si

Year:
2000
Language:
english
File:
PDF, 597 KB
english, 2000
30

Light emission from Er at the As-terminated Si(111) surface

Year:
2000
Language:
english
File:
PDF, 233 KB
english, 2000
31

Time-gated scanning near-field optical microscopy

Year:
2000
Language:
english
File:
PDF, 524 KB
english, 2000
36

Hydrogen adsorption and phase transitions in fullerite

Year:
2000
Language:
english
File:
PDF, 239 KB
english, 2000