Volume 1; Issue 2

Nanotechnology

Volume 1; Issue 2
1

Focused ion beam technology: a bibliography

Year:
1990
Language:
english
File:
PDF, 4.63 MB
english, 1990
2

Models for nanoelectronic devices

Year:
1990
Language:
english
File:
PDF, 1.00 MB
english, 1990
5

Microanalysis to nanoanalysis: measuring composition at high spatial resolution

Year:
1990
Language:
english
File:
PDF, 143 KB
english, 1990
6

Combined scanning force and friction microscopy of mica

Year:
1990
Language:
english
File:
PDF, 586 KB
english, 1990
7

STM for surface structure studies operated at atmospheric air pressure

Year:
1990
Language:
english
File:
PDF, 516 KB
english, 1990