Volume 250; Issue 1-4

Applied Surface Science

Volume 250; Issue 1-4
4

On the role of the interface charge in non-ideal metal–semiconductor contacts

Year:
2005
Language:
english
File:
PDF, 191 KB
english, 2005
7

Electrochromic properties of spray deposited TiO2-doped WO3 thin films

Year:
2005
Language:
english
File:
PDF, 313 KB
english, 2005
10

Morphological study of ternary Ni–Cu–P alloys by atomic force microscopy

Year:
2005
Language:
english
File:
PDF, 1.01 MB
english, 2005
12

Microstructure and oxidation of hot-dip aluminized titanium at high temperature

Year:
2005
Language:
english
File:
PDF, 569 KB
english, 2005
13

Ti/Al p-GaN Schottky barrier height determined by C–V measurements

Year:
2005
Language:
english
File:
PDF, 135 KB
english, 2005
14

Photoconductivity in the ordered vacancy compound CuIn5Se8

Year:
2005
Language:
english
File:
PDF, 341 KB
english, 2005
16

Publisher's Announcement: Welcoming 4th Editor Prof. H. Rudolf

Year:
2005
Language:
english
File:
PDF, 37 KB
english, 2005
17

Publisher's Announcement: Elsevier Editorial System (EES)

Year:
2005
Language:
english
File:
PDF, 34 KB
english, 2005
19

On the barrier inhomogeneities of polyaniline/p-Si/Al structure at low temperature

Year:
2005
Language:
english
File:
PDF, 333 KB
english, 2005
21

Structural and optical properties of thermally evaporated Bi2Te3 films

Year:
2005
Language:
english
File:
PDF, 450 KB
english, 2005
24

Field emission from self-assembly structure of carbon-nanotube films

Year:
2005
Language:
english
File:
PDF, 281 KB
english, 2005
27

A simple method for selective immobilization of silver nanoparticles

Year:
2005
Language:
english
File:
PDF, 395 KB
english, 2005
29

The solubility of phosphorus in GaN

Year:
2005
Language:
english
File:
PDF, 246 KB
english, 2005
34

Laser surface alloying of pure titanium with TiN–B–Si–Ni mixed powders

Year:
2005
Language:
english
File:
PDF, 352 KB
english, 2005
35

Exact solution of the frequency shift in dynamic force microscopy

Year:
2005
Language:
english
File:
PDF, 135 KB
english, 2005
36

Application of a self-sensing conductive probe for Si device imaging

Year:
2005
Language:
english
File:
PDF, 396 KB
english, 2005
40

Author Index

Year:
2005
Language:
english
File:
PDF, 45 KB
english, 2005
41

Subject Index

Year:
2005
Language:
english
File:
PDF, 72 KB
english, 2005
42

Contents Cont....

Year:
2005
Language:
english
File:
PDF, 15 KB
english, 2005