Volume 252; Issue 1

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Applied Surface Science
Volume 252; Issue 1

Applied Surface Science

Volume 252; Issue 1

1

Morphological and elemental characterisation with the high-energy ion-nanoprobe LIPSION

T. Butz, Ch. Meinecke, M. Morawski, T. Reinert, M. Schwertner, D. Spemann, J. Vogt

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 397 KB

english, 2005

2

Post deposition purification of PTCDA thin films

J. Wüsten, Th. Ertl, S. Lach, Ch. Ziegler

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 138 KB

english, 2005

3

Visible-light attachment of SiC linked functionalized organic monolayers on silicon surfaces

Louis C.P.M. de Smet, Aliaksei V. Pukin, Qiao-Yu Sun, Brian J. Eves, Gregory P. Lopinski, Gerben M. Visser, Han Zuilhof, Ernst J.R. Sudhölter

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 320 KB

english, 2005

4

Quantitative XPS imaging—new possibilities with the delay-line detector

U. Vohrer, C. Blomfield, S. Page, A. Roberts

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 248 KB

english, 2005

5

First nucleation steps of vanadium oxide thin films studied by XPS inelastic peak shape analysis

F. Gracia, F. Yubero, J.P. Espinós, A.R. González-Elipe

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 221 KB

english, 2005

6

Mechanical stress in ALD-Al2O3 films

Gunter Krautheim, Thomas Hecht, Stefan Jakschik, Uwe Schröder, Wieland Zahn

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 337 KB

english, 2005

7

Formation of niobium oxynitrides by rapid thermal processing (RTP)

V.A. Matylitskaya, W. Bock, K. Thoma, B.O. Kolbesen

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 288 KB

english, 2005

8

Effect of Ag-alloying addition on the stress–temperature behavior of electroplated copper thin films

S. Menzel, S. Strehle, H. Wendrock, K. Wetzig

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 194 KB

english, 2005

9

New physical techniques for IC functional analysis of on-chip devices and interconnects

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 618 KB

english, 2005

10

Photoelectron spectroscopy of nanocrystalline anatase TiO2 films

Adam Orendorz, Jens Wüsten, Christiane Ziegler, Hubert Gnaser

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 145 KB

english, 2005

11

Multivariate data analysis for depth resolved chemical classification and quantification of sulfur in SNMS

M. Sommer, J. Goschnick

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 324 KB

english, 2005

12

SNMS investigations of platinum-doped nanogranular tin dioxide layers

T. Schneider, M. Sommer, J. Goschnick

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 216 KB

english, 2005

13

Protein adsorption on solid–liquid interfaces monitored by laser-ellipsometry

R. Seitz, R. Brings, R. Geiger

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 172 KB

english, 2005

14

A combined SNMS and EFTEM/EELS study on focused ion beam prepared vanadium nitride thin films

Gerald Kothleitner, M. Rogers, A. Berendes, W. Bock, B.O. Kolbesen

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 825 KB

english, 2005

15

Determination of layer thickness with μXRF

Carla Vogt, Rainer Dargel

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 147 KB

english, 2005

16

Comparing the chemical properties of evaporated and sputtered niobium films on oxidized Si(1 0 0) wafers – preparation of oxynitride films

O. Brunkahl, W. Bock, K. Thoma, B.O. Kolbesen

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 449 KB

english, 2005

17

Characterisation of molybdenum intermediate layers in Cu–C system with SIMS method

K.E. Mayerhofer, C. Schrank, C. Eisenmenger-Sittner, H. Hutter

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 222 KB

english, 2005

18

Range evaluation in SIMS depth profiles of Er-implantations in silicon

K. Mayerhofer, H. Foisner, K. Piplits, G. Hobler, L. Palmetshofer, H. Hutter

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 259 KB

english, 2005

19

Material transport in Al-metallizations of power-loaded SAW structures

S. Menzel, M. Pekarčikova, M. Hofmann, T. Gemming, K. Wetzig

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 172 KB

english, 2005

20

XPS and AES investigations of hard magnetic Nd–Fe–B films

S. Oswald, S. Fähler, S. Baunack

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 163 KB

english, 2005

21

Chemisorption at interfaces between organic semiconductors and metals: role of the electron affinity

M. Knupfer, T. Schwieger

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 130 KB

english, 2005

22

XPS and ARXPS investigations of ultra thin TaN films deposited on SiO2 and Si

M. Zier, S. Oswald, R. Reiche, K. Wetzig

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 323 KB

english, 2005

23

Surface characterisation and interface studies of high-k materials by XPS and TOF-SIMS

A. Besmehn, A. Scholl, E. Rije, U. Breuer

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 308 KB

english, 2005

24

Characterization of PECVD boron carbonitride layers

T. Thamm, K.-U. Körner, W. Bohne, E. Strub, J. Röhrich, S. Stöckel, G. Marx

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 157 KB

english, 2005

25

Characterization of thin Ta–Si–Nx layers of different nitrogen content using XPS, UPS and STM

W. Zahn, D. Hildebrand, S. Menzel, S. Oswald, H. Heuer

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 213 KB

english, 2005

26

13th Applied Surface Analysis Workshop (AOFA 13)

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 64 KB

english, 2005

27

Depth profile and interface analysis in the nm-range

S. Oswald, R. Reiche, M. Zier, S. Baunack, K. Wetzig

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 433 KB

english, 2005

28

On the cleaning of monocrystalline metallic samples from impurities

W. Arabczyk, U. Narkiewicz

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 344 KB

english, 2005

29

Phase analysis of TaN/Ta barrier layers in sub-micrometer trench structures for Cu interconnects

M. Traving, I. Zienert, E. Zschech, G. Schindler, W. Steinhögl, M. Engelhardt

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 408 KB

english, 2005

30

Corrosion of aluminium components studied with MIES, UPS and XPS

Martin Frerichs, Florian Voigts, Sven Hollunder, Rainer Masendorf, Alfons Esderts, Wolfgang Maus-Friedrichs

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 238 KB

english, 2005

31

Analytical methods for the characterisation of leaf surfaces: a contribution to understand the processes of biomineralization

Simone Hinke, Günter Marx, Rüdiger Fehlhaber, Otto Wienhaus

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 215 KB

english, 2005

32

Low energy RBS and SIMS analysis of the SiGe quantum well

D. Krecar, M. Rosner, M. Draxler, P. Bauer, H. Hutter

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 130 KB

english, 2005

33

Elementary processes at semiconductor/electrolyte interfaces: perspectives and limits of electron spectroscopy

Th. Mayer, M. Lebedev, R. Hunger, W. Jaegermann

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 745 KB

english, 2005

34

Investigations of corrosion phenomena on gold coins with SIMS

K.E. Mayerhofer, K. Piplits, R. Traum, M. Griesser, H. Hutter

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 257 KB

english, 2005

35

Comparison of reference-free X-ray fluorescence analysis and X-ray reflectometry for thickness determination in the nanometer range

Michael Kolbe, Burkhard Beckhoff, Michael Krumrey, Gerhard Ulm

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 128 KB

english, 2005

36

Laboratory LPP EUV reflectometer working with non-polarized radiation

Ludwig van Loyen, Thomas Böttger, Stefan Schädlich, Stefan Braun, Thomas Foltyn, Andreas Leson, Frank Scholze, Stephan Müllender

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 244 KB

english, 2005

37

Electronic structure and topography of annealed SrTiO3(1 1 1) surfaces studied with MIES and STM

Anissa Gömann, Karsten Gömann, Martin Frerichs, Volker Kempter, Günter Borchardt, Wolfgang Maus-Friedrichs

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 122 KB

english, 2005

38

Alkyl chain effects in thin films of substituted phthalocyanines studied using infrared spectroscopy

A. Haug, S. Harbeck, D. Dini, M. Hanack, M.J. Cook, H. Peisert, T. Chassé

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 164 KB

english, 2005

39

IR and SFM study of PTCDA thin films on different substrates

Steffen Berger, Kathrin Heimer, H.G. Mack, Christiane Ziegler

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 210 KB

english, 2005

40

Nm-scale resolution studies of the bond interface between ultrasonically welded Al-alloys by an analytical TEM: a path to comprehend bonding phenomena?

A. Brodyanski, C. Born, M. Kopnarski

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 261 KB

english, 2005

41

SIMS investigation of gettering centres produced by phosphorus MeV ion implantation

D. Krecar, M. Fuchs, R. Kögler, H. Hutter

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 192 KB

english, 2005

42

2D and 3D SIMS investigations on sintered steels

Dragan Krecar, Jürgen Zwanziger, Vassilka Vassileva, Herbert Danninger, Herbert Hutter

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 228 KB

english, 2005

43

Investigation of organic impurities adsorbed on and incorporated into electroplated copper layers

M. Stangl, V. Dittel, J. Acker, V. Hoffmann, W. Gruner, S. Strehle, K. Wetzig

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 255 KB

english, 2005

44

XPS investigation of the PTFE induced hydrophobic properties of electrodes for low temperature fuel cells

M. Schulze, C. Christenn

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 135 KB

english, 2005

45

Advances in X-ray excitation of Kossel patterns by a focusing polycapillary lens

E. Langer, S. Däbritz, W. Hauffe, M. Haschke

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 465 KB

english, 2005

46

Shells on nanowires detected by analytical TEM

Jürgen Thomas, Thomas Gemming

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 416 KB

english, 2005

47

Investigation of ultrathin tantalum based diffusion barrier films using AES and TEM

Kornelia Dittmar, Hans-Jürgen Engelmann, M. Peikert, E. Wieser, J.V. Borany

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 279 KB

english, 2005

48

Analysis of new electrical signals in respect to quantification of radio frequency glow discharge emission spectrometry

L. Wilken, V. Hoffmann, K. Wetzig

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 168 KB

english, 2005

49

Electronic properties of the organic semiconductor hetero-interface CuPc/C60

O.V. Molodtsova, T. Schwieger, M. Knupfer

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 158 KB

english, 2005

50

Analysis of chemical dissolution of the barrier layer of porous oxide on aluminum thin films using a re-anodizing technique

I. Vrublevsky, V. Parkoun, V. Sokol, J. Schreckenbach

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 170 KB

english, 2005

51

Characterization of oxide layers on amorphous Zr-based alloys by Auger electron spectroscopy with sputter depth profiling

S. Baunack, U. Kamachi Mudali, A. Gebert

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 278 KB

english, 2005

52

Analysis of Mg–B compounds by means of Auger electron microprobe

S. Baunack, O. Perner, C. Fischer

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 236 KB

english, 2005

53

Quantitative element mapping of Mg alloys by laser ablation ICP-MS and EPMA

Christopher Latkoczy, Yves Müller, Patrik Schmutz, Detlef Günther

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 209 KB

english, 2005

54

Initial bioadhesion on surfaces in the oral cavity investigated by scanning force microscopy

N. Schwender, K. Huber, F. Al Marrawi, M. Hannig, Ch. Ziegler

Journal:

Applied Surface Science

Year:

2005

Language:

english

File:

PDF, 404 KB

english, 2005