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Volume 252; Issue 1
Main
Applied Surface Science
Volume 252; Issue 1
Applied Surface Science
Volume 252; Issue 1
1
Morphological and elemental characterisation with the high-energy ion-nanoprobe LIPSION
T. Butz
,
Ch. Meinecke
,
M. Morawski
,
T. Reinert
,
M. Schwertner
,
D. Spemann
,
J. Vogt
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 397 KB
Your tags:
english, 2005
2
Post deposition purification of PTCDA thin films
J. Wüsten
,
Th. Ertl
,
S. Lach
,
Ch. Ziegler
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 138 KB
Your tags:
english, 2005
3
Visible-light attachment of SiC linked functionalized organic monolayers on silicon surfaces
Louis C.P.M. de Smet
,
Aliaksei V. Pukin
,
Qiao-Yu Sun
,
Brian J. Eves
,
Gregory P. Lopinski
,
Gerben M. Visser
,
Han Zuilhof
,
Ernst J.R. Sudhölter
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 320 KB
Your tags:
english, 2005
4
Quantitative XPS imaging—new possibilities with the delay-line detector
U. Vohrer
,
C. Blomfield
,
S. Page
,
A. Roberts
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 248 KB
Your tags:
english, 2005
5
First nucleation steps of vanadium oxide thin films studied by XPS inelastic peak shape analysis
F. Gracia
,
F. Yubero
,
J.P. Espinós
,
A.R. González-Elipe
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 221 KB
Your tags:
english, 2005
6
Mechanical stress in ALD-Al2O3 films
Gunter Krautheim
,
Thomas Hecht
,
Stefan Jakschik
,
Uwe Schröder
,
Wieland Zahn
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 337 KB
Your tags:
english, 2005
7
Formation of niobium oxynitrides by rapid thermal processing (RTP)
V.A. Matylitskaya
,
W. Bock
,
K. Thoma
,
B.O. Kolbesen
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 288 KB
Your tags:
english, 2005
8
Effect of Ag-alloying addition on the stress–temperature behavior of electroplated copper thin films
S. Menzel
,
S. Strehle
,
H. Wendrock
,
K. Wetzig
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 194 KB
Your tags:
english, 2005
9
New physical techniques for IC functional analysis of on-chip devices and interconnects
Christian Boit
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 618 KB
Your tags:
english, 2005
10
Photoelectron spectroscopy of nanocrystalline anatase TiO2 films
Adam Orendorz
,
Jens Wüsten
,
Christiane Ziegler
,
Hubert Gnaser
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 145 KB
Your tags:
english, 2005
11
Multivariate data analysis for depth resolved chemical classification and quantification of sulfur in SNMS
M. Sommer
,
J. Goschnick
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 324 KB
Your tags:
english, 2005
12
SNMS investigations of platinum-doped nanogranular tin dioxide layers
T. Schneider
,
M. Sommer
,
J. Goschnick
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 216 KB
Your tags:
english, 2005
13
Protein adsorption on solid–liquid interfaces monitored by laser-ellipsometry
R. Seitz
,
R. Brings
,
R. Geiger
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 172 KB
Your tags:
english, 2005
14
A combined SNMS and EFTEM/EELS study on focused ion beam prepared vanadium nitride thin films
Gerald Kothleitner
,
M. Rogers
,
A. Berendes
,
W. Bock
,
B.O. Kolbesen
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 825 KB
Your tags:
english, 2005
15
Determination of layer thickness with μXRF
Carla Vogt
,
Rainer Dargel
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 147 KB
Your tags:
english, 2005
16
Comparing the chemical properties of evaporated and sputtered niobium films on oxidized Si(1 0 0) wafers – preparation of oxynitride films
O. Brunkahl
,
W. Bock
,
K. Thoma
,
B.O. Kolbesen
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 449 KB
Your tags:
english, 2005
17
Characterisation of molybdenum intermediate layers in Cu–C system with SIMS method
K.E. Mayerhofer
,
C. Schrank
,
C. Eisenmenger-Sittner
,
H. Hutter
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 222 KB
Your tags:
english, 2005
18
Range evaluation in SIMS depth profiles of Er-implantations in silicon
K. Mayerhofer
,
H. Foisner
,
K. Piplits
,
G. Hobler
,
L. Palmetshofer
,
H. Hutter
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 259 KB
Your tags:
english, 2005
19
Material transport in Al-metallizations of power-loaded SAW structures
S. Menzel
,
M. Pekarčikova
,
M. Hofmann
,
T. Gemming
,
K. Wetzig
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 172 KB
Your tags:
english, 2005
20
XPS and AES investigations of hard magnetic Nd–Fe–B films
S. Oswald
,
S. Fähler
,
S. Baunack
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 163 KB
Your tags:
english, 2005
21
Chemisorption at interfaces between organic semiconductors and metals: role of the electron affinity
M. Knupfer
,
T. Schwieger
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 130 KB
Your tags:
english, 2005
22
XPS and ARXPS investigations of ultra thin TaN films deposited on SiO2 and Si
M. Zier
,
S. Oswald
,
R. Reiche
,
K. Wetzig
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 323 KB
Your tags:
english, 2005
23
Surface characterisation and interface studies of high-k materials by XPS and TOF-SIMS
A. Besmehn
,
A. Scholl
,
E. Rije
,
U. Breuer
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 308 KB
Your tags:
english, 2005
24
Characterization of PECVD boron carbonitride layers
T. Thamm
,
K.-U. Körner
,
W. Bohne
,
E. Strub
,
J. Röhrich
,
S. Stöckel
,
G. Marx
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 157 KB
Your tags:
english, 2005
25
Characterization of thin Ta–Si–Nx layers of different nitrogen content using XPS, UPS and STM
W. Zahn
,
D. Hildebrand
,
S. Menzel
,
S. Oswald
,
H. Heuer
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 213 KB
Your tags:
english, 2005
26
13th Applied Surface Analysis Workshop (AOFA 13)
Klaus Wetzig
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 64 KB
Your tags:
english, 2005
27
Depth profile and interface analysis in the nm-range
S. Oswald
,
R. Reiche
,
M. Zier
,
S. Baunack
,
K. Wetzig
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 433 KB
Your tags:
english, 2005
28
On the cleaning of monocrystalline metallic samples from impurities
W. Arabczyk
,
U. Narkiewicz
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 344 KB
Your tags:
english, 2005
29
Phase analysis of TaN/Ta barrier layers in sub-micrometer trench structures for Cu interconnects
M. Traving
,
I. Zienert
,
E. Zschech
,
G. Schindler
,
W. Steinhögl
,
M. Engelhardt
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 408 KB
Your tags:
english, 2005
30
Corrosion of aluminium components studied with MIES, UPS and XPS
Martin Frerichs
,
Florian Voigts
,
Sven Hollunder
,
Rainer Masendorf
,
Alfons Esderts
,
Wolfgang Maus-Friedrichs
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 238 KB
Your tags:
english, 2005
31
Analytical methods for the characterisation of leaf surfaces: a contribution to understand the processes of biomineralization
Simone Hinke
,
Günter Marx
,
Rüdiger Fehlhaber
,
Otto Wienhaus
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 215 KB
Your tags:
english, 2005
32
Low energy RBS and SIMS analysis of the SiGe quantum well
D. Krecar
,
M. Rosner
,
M. Draxler
,
P. Bauer
,
H. Hutter
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 130 KB
Your tags:
english, 2005
33
Elementary processes at semiconductor/electrolyte interfaces: perspectives and limits of electron spectroscopy
Th. Mayer
,
M. Lebedev
,
R. Hunger
,
W. Jaegermann
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 745 KB
Your tags:
english, 2005
34
Investigations of corrosion phenomena on gold coins with SIMS
K.E. Mayerhofer
,
K. Piplits
,
R. Traum
,
M. Griesser
,
H. Hutter
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 257 KB
Your tags:
english, 2005
35
Comparison of reference-free X-ray fluorescence analysis and X-ray reflectometry for thickness determination in the nanometer range
Michael Kolbe
,
Burkhard Beckhoff
,
Michael Krumrey
,
Gerhard Ulm
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 128 KB
Your tags:
english, 2005
36
Laboratory LPP EUV reflectometer working with non-polarized radiation
Ludwig van Loyen
,
Thomas Böttger
,
Stefan Schädlich
,
Stefan Braun
,
Thomas Foltyn
,
Andreas Leson
,
Frank Scholze
,
Stephan Müllender
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 244 KB
Your tags:
english, 2005
37
Electronic structure and topography of annealed SrTiO3(1 1 1) surfaces studied with MIES and STM
Anissa Gömann
,
Karsten Gömann
,
Martin Frerichs
,
Volker Kempter
,
Günter Borchardt
,
Wolfgang Maus-Friedrichs
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 122 KB
Your tags:
english, 2005
38
Alkyl chain effects in thin films of substituted phthalocyanines studied using infrared spectroscopy
A. Haug
,
S. Harbeck
,
D. Dini
,
M. Hanack
,
M.J. Cook
,
H. Peisert
,
T. Chassé
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 164 KB
Your tags:
english, 2005
39
IR and SFM study of PTCDA thin films on different substrates
Steffen Berger
,
Kathrin Heimer
,
H.G. Mack
,
Christiane Ziegler
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 210 KB
Your tags:
english, 2005
40
Nm-scale resolution studies of the bond interface between ultrasonically welded Al-alloys by an analytical TEM: a path to comprehend bonding phenomena?
A. Brodyanski
,
C. Born
,
M. Kopnarski
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 261 KB
Your tags:
english, 2005
41
SIMS investigation of gettering centres produced by phosphorus MeV ion implantation
D. Krecar
,
M. Fuchs
,
R. Kögler
,
H. Hutter
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 192 KB
Your tags:
english, 2005
42
2D and 3D SIMS investigations on sintered steels
Dragan Krecar
,
Jürgen Zwanziger
,
Vassilka Vassileva
,
Herbert Danninger
,
Herbert Hutter
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 228 KB
Your tags:
english, 2005
43
Investigation of organic impurities adsorbed on and incorporated into electroplated copper layers
M. Stangl
,
V. Dittel
,
J. Acker
,
V. Hoffmann
,
W. Gruner
,
S. Strehle
,
K. Wetzig
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 255 KB
Your tags:
english, 2005
44
XPS investigation of the PTFE induced hydrophobic properties of electrodes for low temperature fuel cells
M. Schulze
,
C. Christenn
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 135 KB
Your tags:
english, 2005
45
Advances in X-ray excitation of Kossel patterns by a focusing polycapillary lens
E. Langer
,
S. Däbritz
,
W. Hauffe
,
M. Haschke
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 465 KB
Your tags:
english, 2005
46
Shells on nanowires detected by analytical TEM
Jürgen Thomas
,
Thomas Gemming
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 416 KB
Your tags:
english, 2005
47
Investigation of ultrathin tantalum based diffusion barrier films using AES and TEM
Kornelia Dittmar
,
Hans-Jürgen Engelmann
,
M. Peikert
,
E. Wieser
,
J.V. Borany
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 279 KB
Your tags:
english, 2005
48
Analysis of new electrical signals in respect to quantification of radio frequency glow discharge emission spectrometry
L. Wilken
,
V. Hoffmann
,
K. Wetzig
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 168 KB
Your tags:
english, 2005
49
Electronic properties of the organic semiconductor hetero-interface CuPc/C60
O.V. Molodtsova
,
T. Schwieger
,
M. Knupfer
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 158 KB
Your tags:
english, 2005
50
Analysis of chemical dissolution of the barrier layer of porous oxide on aluminum thin films using a re-anodizing technique
I. Vrublevsky
,
V. Parkoun
,
V. Sokol
,
J. Schreckenbach
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 170 KB
Your tags:
english, 2005
51
Characterization of oxide layers on amorphous Zr-based alloys by Auger electron spectroscopy with sputter depth profiling
S. Baunack
,
U. Kamachi Mudali
,
A. Gebert
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 278 KB
Your tags:
english, 2005
52
Analysis of Mg–B compounds by means of Auger electron microprobe
S. Baunack
,
O. Perner
,
C. Fischer
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 236 KB
Your tags:
english, 2005
53
Quantitative element mapping of Mg alloys by laser ablation ICP-MS and EPMA
Christopher Latkoczy
,
Yves Müller
,
Patrik Schmutz
,
Detlef Günther
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 209 KB
Your tags:
english, 2005
54
Initial bioadhesion on surfaces in the oral cavity investigated by scanning force microscopy
N. Schwender
,
K. Huber
,
F. Al Marrawi
,
M. Hannig
,
Ch. Ziegler
Journal:
Applied Surface Science
Year:
2005
Language:
english
File:
PDF, 404 KB
Your tags:
english, 2005
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