Volume 28; Issue 2

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Applied Surface Science
Volume 28; Issue 2

Applied Surface Science

Volume 28; Issue 2

1

Characterization of silicon compounds using the Auger parameter in X-ray Photoelectron Spectroscopy (XPS)

Shigemi Kohiki, Shinji Ozaki, Tomoko Hamada, Kazuo Taniguchi

Journal:

Applied Surface Science

Year:

1987

Language:

english

File:

PDF, 474 KB

english, 1987

2

Surface structure and catalytic activity of rapidly quenched amorphous iron based alloys: I. Effect of the cooling rate

G. Kisfaludi, Z. Schay, L. Guczi, G. Konczos, L. Lovas, P. Kovács

Journal:

Applied Surface Science

Year:

1987

Language:

english

File:

PDF, 918 KB

english, 1987

3

A search for geometrical lattice matching in semiconductor heteroepitaxy

P.M.J. Marée, K. Nakagawa, F.W. Saris, J. Haisma

Journal:

Applied Surface Science

Year:

1987

Language:

english

File:

PDF, 484 KB

english, 1987

4

The influence of incongruent decomposition and oxygen chemisorption on the temperature and pressure dependence of the conductivity of zinc oxide films

P. Bonasewicz, W. Hirschwald, G. Neumann

Journal:

Applied Surface Science

Year:

1987

Language:

english

File:

PDF, 588 KB

english, 1987

5

Dissociation reactions of CO Gas on Fe and Fe3O4 surfaces observed by Raman-ellipsometry spectroscopy

Masao Watanabe, Toru Kadowaki

Journal:

Applied Surface Science

Year:

1987

Language:

english

File:

PDF, 1.18 MB

english, 1987

6

Erratum

Journal:

Applied Surface Science

Year:

1987

File:

PDF, 35 KB

1987

7

AES sputtering depth profile analysis of C/W layered synthetic microstructures

D. Roux, A. Rolland, P. Renucci, J.P. Petrakian

Journal:

Applied Surface Science

Year:

1987

Language:

english

File:

PDF, 551 KB

english, 1987

8

On the oxide formation on stainless steels AISI 304 and incoloy 800H investigated with XPS

J.C. Langevoort, I. Sutherland, L.J. Hanekamp, P.J. Gellings

Journal:

Applied Surface Science

Year:

1987

Language:

english

File:

PDF, 724 KB

english, 1987

9

Sputter depth profiling of thin films with LEIS and LENRS

S.G. Puranik, B.V. King

Journal:

Applied Surface Science

Year:

1987

Language:

english

File:

PDF, 401 KB

english, 1987