Volume 453

6

Admittance measurements in the quantum Hall effect regime

Year:
2014
Language:
english
File:
PDF, 1.02 MB
english, 2014
13

Dielectric and baric characteristics of TlS single crystal

Year:
2014
Language:
english
File:
PDF, 340 KB
english, 2014
25

An EPR investigation of SiOx films with columnar structure

Year:
2014
Language:
english
File:
PDF, 781 KB
english, 2014
29

Preface

Year:
2014
Language:
english
File:
PDF, 336 KB
english, 2014
31

Parameterization of the dielectric function of semiconductor nanocrystals

Year:
2014
Language:
english
File:
PDF, 1007 KB
english, 2014
33

.

Year:
2014
File:
PDF, 13 KB
2014
35

Editorial Board

Year:
2014
Language:
english
File:
PDF, 63 KB
english, 2014