Volume 25; Issue 4

Solid-State Electronics

Volume 25; Issue 4
2

Generation-recombination noise in p-type silicon

G. Bosman, R.J.J. Zijlstra
Journal:
Solid-State Electronics
Year:
1982
Language:
english
File:
PDF, 837 KB
english, 1982
3

Photovoltaic effects in Cu2OCu solar cells grown by anodic oxidation

E. Fortin, D. Masson
Journal:
Solid-State Electronics
Year:
1982
Language:
english
File:
PDF, 230 KB
english, 1982
6

Deep metal-related centres in germanium

S.J. Pearton
Journal:
Solid-State Electronics
Year:
1982
Language:
english
File:
PDF, 431 KB
english, 1982
7

Dependence of MOSFET noise parameters in n-channel MOSFETs on oxide thickness

H.S. Park, A. van der Ziel
Journal:
Solid-State Electronics
Year:
1982
Language:
english
File:
PDF, 198 KB
english, 1982
8

A numerical analysis of bulk-barrier diodes

E. Langer, S. Selberherr, H. Mader
Journal:
Solid-State Electronics
Year:
1982
Language:
english
File:
PDF, 617 KB
english, 1982
9

Electron trap behaviour in Te-doped GaAs0.6P0.4

I.D. Henning, H. Thomas
Journal:
Solid-State Electronics
Year:
1982
Language:
english
File:
PDF, 628 KB
english, 1982