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Volume 44; Issue 5
Main
Solid-State Electronics
Volume 44; Issue 5
Solid-State Electronics
Volume 44; Issue 5
1
Index
Journal:
Solid-State Electronics
Year:
2000
File:
PDF, 23 KB
Your tags:
2000
2
Editorial
Journal:
Solid-State Electronics
Year:
2000
File:
PDF, 198 KB
Your tags:
2000
3
Overview of status and challenges of system testing on chip with embedded DRAMS
T Falter
,
D Richter
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 214 KB
Your tags:
english, 2000
4
Optimization of 0.18 μm CMOS devices by coupled process and device simulation
A. Burenkov
,
K. Tietzel
,
J. Lorenz
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 2.36 MB
Your tags:
english, 2000
5
Silicon-on-insulator: materials aspects and applications
Andreas Plößl
,
Gertrud Kräuter
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 779 KB
Your tags:
english, 2000
6
Tailoring dopant diffusion for advanced SiGe:C heterojunction bipolar transistors
H. Rücker
,
B. Heinemann
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 285 KB
Your tags:
english, 2000
7
Efficient backup schemes for processors in embedded systems
M Pflanz
,
H.T Vierhaus
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 496 KB
Your tags:
english, 2000
8
Two- and three-dimensional numerical modeling of copper electroplating for advanced ULSI metallization
G. Ritter
,
P. McHugh
,
G. Wilson
,
T. Ritzdorf
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 690 KB
Your tags:
english, 2000
9
Nonlinear optical characterization of the surface of silicon wafers: In-situ detection of external stress
J Reif
,
R Schmid
,
Th Schneider
,
D Wolfframm
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 350 KB
Your tags:
english, 2000
10
Reliability of built in aluminum interconnection with low-ε dielectric based on porous anodic alumina
S Lazarouk
,
S Katsouba
,
A Demianovich
,
V Stanovski
,
S Voitech
,
V Vysotski
,
V Ponomar
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 534 KB
Your tags:
english, 2000
11
Crystal growth under heat field rotation conditions
Alexandr E Kokh
,
Nadegda G Kononova
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 569 KB
Your tags:
english, 2000
12
Influence of melt convection on the interface during Czochralski crystal growth
W. Miller
,
U. Rehse
,
K. Böttcher
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 726 KB
Your tags:
english, 2000
13
Field effect in organic devices with solution-doped arylamino-poly-(phenylene-vinylene)
S. Scheinert
,
G. Paasch
,
S. Pohlmann
,
H.-H. Hörhold
,
R. Stockmann
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 493 KB
Your tags:
english, 2000
14
Polymeric electrodes
G Appel
,
R Mikalo
,
K Henkel
,
A Oprea
,
A Yfantis
,
I Paloumpa
,
D Schmeißer
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 690 KB
Your tags:
english, 2000
15
Front-end process simulation
C.S Rafferty
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 411 KB
Your tags:
english, 2000
16
An equilibrium model for buried SiGe strained layers
A. Fischer
,
H.-J. Osten
,
H. Richter
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 163 KB
Your tags:
english, 2000
17
Cross-sectional STM/STS — a useful tool for identification of dopants in silicon
R. Nuffer
,
H.-J. Müssig
,
J. Dabrowski
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 1.62 MB
Your tags:
english, 2000
18
A spectro-microscopic approach for spatially resolved characterisation of semiconductor structures in PEEM
P Hoffmann
,
R.P Mikalo
,
D Schmeißer
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 738 KB
Your tags:
english, 2000
19
Dopant diffusion during rapid thermal oxidation
A Stadler
,
T Sulima
,
J Schulze
,
C Fink
,
A Kottantharayil
,
W Hansch
,
H Baumgärtner
,
I Eisele
,
W Lerch
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 331 KB
Your tags:
english, 2000
20
Integration of quantum transport models in classical device simulators
P.N. Racec
,
U. Wulf
,
J. Kučera
Journal:
Solid-State Electronics
Year:
2000
Language:
english
File:
PDF, 265 KB
Your tags:
english, 2000
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