Volume 51; Issue 6

Solid-State Electronics

Volume 51; Issue 6
4

Modeling the effect of source/drain junction depth on bulk-MOSFET scaling

Year:
2007
Language:
english
File:
PDF, 289 KB
english, 2007
6

On the temperature stability of integrated MIS low-pass filter structures

Year:
2007
Language:
english
File:
PDF, 292 KB
english, 2007
9

A study of ion implantation into crystalline germanium

Year:
2007
Language:
english
File:
PDF, 595 KB
english, 2007
10

Compact K-band bandpass filter on high-k LiNbO3 substrate

Year:
2007
Language:
english
File:
PDF, 254 KB
english, 2007
14

Qualitative analysis on gain compression in power MOS transistor

Year:
2007
Language:
english
File:
PDF, 156 KB
english, 2007
16

Impact of surface state modeling on the characteristics of InP/GaAsSb/InP DHBTs

Year:
2007
Language:
english
File:
PDF, 899 KB
english, 2007
21

A single-poly EEPROM cell structure compatible to standard CMOS process

Year:
2007
Language:
english
File:
PDF, 658 KB
english, 2007
25

Editorial Board

Year:
2007
Language:
english
File:
PDF, 81 KB
english, 2007
30

MOSFET I–V characteristics at small and large drain biases in the linear region

Year:
2007
Language:
english
File:
PDF, 277 KB
english, 2007