Volume 18; Issue 12

Surface and Interface Analysis

Volume 18; Issue 12

1

Masthead

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 89 KB

english, 1992

2

First steps of the Ni–20 Cr alloy oxidation studied by Auger electron microprobe

J. F. Schmitt, N. Pacia, P. Pigeat, B. Weber

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 478 KB

english, 1992

3

Determination of the depth profiles of ion-implanted impurities by electron probe x-ray microanalysis

Andrey P. Alexeyev

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 460 KB

english, 1992

4

Correction of Peak Shift and Classification of Change of X-ray Photoelectron Spectra of Oxides as a Result of Ion Sputtering

Satoshi Hashimoto, Kichinosuke Hirokawa, Yasuo Fukuda, Ken-ichi Suzuki, Toshiko Suzuki, Noriaki Usuki, Norio Gennai, Sizuo Yoshida, Mitsuru Koda, Hiroshi Sezaki, Hiroshi Horie, Akihiro Tanaka, Takashi

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 656 KB

english, 1992

5

Technique for XPS measurements of volatile adsorbed layers: Application to studies of sulphide flotation

I. Kartio, K. Laajalehto, E. Suoninen, S. Karthe, R. Szargan

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 428 KB

english, 1992

6

Characterization of hydroxylated oxide film on iron surfaces and its acid–base properties using XPS

G. Kurbatov, E. Darque-Ceretti, M. Aucouturier

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 959 KB

english, 1992

7

An Electron Spectroscopic Investigation of Attenuation Lengths of Electrons in SiO2 in the Energy Range 450 eV ≤ Ekin ≤ 3100 eV

H. Ebel, M. F. Ebel, R. Svagera, A. Hofmann

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 256 KB

english, 1992

8

High-spatial-resolution surface imaging of inorganic and organic structures by multiphoton post-ionization of sputtered neutrals and time-of-flight mass spectrometry

M. Tehorst, R. Möllers, E. Niehuis, A. Benninghoven

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 776 KB

english, 1992

9

Forthcoming Events

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 85 KB

english, 1992

10

Recently Accepted Papers

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 100 KB

english, 1992