Volume 18; Issue 2

Surface and Interface Analysis

Volume 18; Issue 2

1

Masthead

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 89 KB

english, 1992

2

Preface

Journal:

Surface and Interface Analysis

Year:

1992

File:

PDF, 27 KB

1992

3

Secondary ion mass spectrometry—first microelectronics, now the rest of the world

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 585 KB

english, 1992

4

Electronic properties of disordered anodic TiO2 (001) surfaces: Application of the equation-of-motion method

Nacir Tit, J. W. Halley, M. T. Michalewicz

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 469 KB

english, 1992

5

Determining the thickness of very thin films of TiW

Harland G. Tompkins

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 458 KB

english, 1992

6

Structural and electronic studies of clean and oxidized thin Fe films on polycrystalline copper

S. Di Nardo, M. Passacantando, P. Picozzi, S. Santucci, L. Lozzi, M. De Crescenzi, H. den Daas

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 397 KB

english, 1992

7

Analysis of zinc selenide by secondary ion mass spectrometry: Relative sensitivity factors and detection limits

Steven J. Pachuta, Terry L. Smith

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 360 KB

english, 1992

8

Study of concentration-dependent dielectric properties of n-type GaAs using variable angle spectroscopic ellipsometry

Paul G. Snyder, Yi-Ming Xiong

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 476 KB

english, 1992

9

Characterization of polycrystalline silicon thin-film multilayers by variable angle spectroscopic ellipsometry

Paul G. Snyder, Yi-Ming Xiong, John A. Woollam, Eric R. Krosche, Yale Strausser

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 494 KB

english, 1992

10

Auger and x-ray photoelectron spectroscopy study of localized intergranular cracking in a nickel—chromium—molybdenum—iron alloy

C. A. Bradbury, K. E. Sturgill, D. C. McKissick

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 585 KB

english, 1992

11

Optical Characterization of Silicon Oxynitride Thin Films by Variable Angle Spectroscopic Ellipsometry

Yi-Ming Xiong, Paul G. Snyder, John A. Woollam, G. A. Al-Jumaily, F. J. Gagliardi, L. J. Mizerka

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 424 KB

english, 1992

12

Characterization of epitaxial SiGe thin films on Si: Analytical considerations

K. L. Evans, T. A. Anderson, M. Liaw, R. Gregory, L. V. Munukutla, R. J. Graham, M. R. McCartney

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 781 KB

english, 1992

13

Rapid characterization of an unknown optical coating on soda-lime silica glass using dynamic SIMS

Brad A. Carlson, Bradway F. Phillips

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 330 KB

english, 1992

14

Quantification of surface hydroxides using chemical labeling and XPS

Tuan A. Dang, R. Gnanasekaran, Denise D. Deppe

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 447 KB

english, 1992

15

Application of sample rotation to secondary ion mass spectrometry depth profiling of aluminum metallization

F. A. Stevie, J. L. Moore

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 483 KB

english, 1992

16

Effects of morphology on the electrical and optical properties of thin bismuth films

T. M. Christensen, D. I. Dalton

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 701 KB

english, 1992

17

Surface oxidation of silicon carbide platelets as studied by x-ray photoelectron spectroscopy and bremsstrahlung-excited Auger electron spectroscopy

Pu Sen Wang, Subhas G. Malghan, Stephen M. Hsu, T. N. Wittberg

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 364 KB

english, 1992

18

Langmuir-Blodgett films of rigid rod oligoimides on gold: An x-ray photoelectron spectroscopy study

Ljiljana Atanasoska, Vince Cammarata, Barbara J. Stallman, Wing Sum V. Kwan, Larry L. Miller

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 999 KB

english, 1992

19

AES determination of compositional variation in LPCVD tungsten silicide films in confined spaces

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 493 KB

english, 1992

20

Forthcoming Events

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 79 KB

english, 1992

21

Recently Accepted Papers

Journal:

Surface and Interface Analysis

Year:

1992

Language:

english

File:

PDF, 91 KB

english, 1992