Volume 24; Issue 6

Surface and Interface Analysis

Volume 24; Issue 6

1

Surface Analysis by SNMS: Femtosecond Laser Postionization of Sputtered and Laser Desorbed Atoms

Nicolussi, G�nther K., Pellin, Michael J., Lykke, Keith R., Trevor, Jennifer L., Mencer, Donald E., Davis, Andrew M.

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 866 KB

english, 1996

2

Factors Affecting the Quantification of Boron in SiO2 and Si by Sputtered Neutral Mass Spectrometry

Wise, Michael L., Moriya, Netzer, Downey, Stephen W.

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 401 KB

english, 1996

3

Auger Electron Spectroscopy of Boron Nitride in Hot-rolled Graphitized Steel Sheet

Mega, Tetsuya, Morimoto, Ryoji, Morita, Masahiko, Shimomura, Jun-Ichi

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 1.77 MB

english, 1996

4

Surface Characterization of EMA Copolymers Using XPS and ToF-SIMS

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 927 KB

english, 1996

5

Sputtering Yield Changes, Surface Movement and Apparent Profile Shifts in SIMS Depth Analyses of Silicon Using Oxygen Primary Ions

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 1.13 MB

english, 1996

6

All-optical Mass Spectrometric System Based on Picosecond Laser Pulses

Sch�tze, M., Trappe, C., Tabellion, M., L�pke, G., Kurz, H.

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 759 KB

english, 1996

7

Innovative Methods for a Deconvolution of XPS Spectra from Plasma-oxidized Polyethylene

M�hl, S., Lachnitt, J., Niemann, R., Neumann, M., Baalmann, A., Kruse, A., Schlett, V.

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 597 KB

english, 1996

8

CEMS and AES Investigations on Iron Silicides

Reuther, H., Dobler, M.

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 469 KB

english, 1996

9

Effect of Ion Beam Mixing and Compound Formation on Sputter Depth Profile of a Ta/Si Multilayer Thin Film

Stepanova, M. G.

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 323 KB

english, 1996

10

Surface Morphology of a PVC/PMMA Blend Studied by ToF-SIMS

Briggs, D., Fletcher, I. W., Reichlmaier, S., Agulo-Sanchez, J. L., Short, R. D.

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 1.83 MB

english, 1996

11

Differential Charging in XPS. Part I: Demonstration of Lateral Charging in a Bulk Insulator Using Imaging XPS

Tielsch, Brian J., Fulghum, Julia E.

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 1.96 MB

english, 1996

12

Curve-Fitting Errors in the Article ?Backscattering Factor for KLL Auger Yield from Film-Substrate Systems? by C. L. Leeet al. [Surf. Interface Anal., 24, 15 (1996)]

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 75 KB

english, 1996

13

Masthead

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 85 KB

english, 1996

14

Forthcoming events

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 81 KB

english, 1996

15

Recently accepted papers

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 107 KB

english, 1996