Volume 25; Issue 9

Surface and Interface Analysis

Volume 25; Issue 9

1

A Study of the Chemical Bonding and Microstructure of Ion Beam-deposited CNxFilms Including an XPS C 1s Peak Simulation

Baker, M. A., Hammer, P.

Journal:

Surface and Interface Analysis

Year:

1997

Language:

english

File:

PDF, 504 KB

english, 1997

2

Evaluation of X-ray-excited Valence Band Measurements for the Determination of the Surface Composition of Model Thermoplastic Olefins

Schmitz, P. J., Holubka, J. W., Srinivasan, Satchit

Journal:

Surface and Interface Analysis

Year:

1997

Language:

english

File:

PDF, 365 KB

english, 1997

3

Model for Analysis of XPS Electron Take-off Angle Experiments in Layer-structured Samples: Determination of Attenuation Lengths in a Well-characterized Langmuir-Blodgett Film

Suzuki, Noboru, Iimura, Ken-ichi, Satoh, Shin, Saito, Yoshinari, Kato, Teiji, Tanaka, Akihiro

Journal:

Surface and Interface Analysis

Year:

1997

Language:

english

File:

PDF, 443 KB

english, 1997

4

Surface Analysis of a Hydrothermally Treated H-ZSM-5 Zeolite

Marschmeyer, Steffen, Papp, Helmut

Journal:

Surface and Interface Analysis

Year:

1997

Language:

english

File:

PDF, 342 KB

english, 1997

5

TPD, XPS and ESR Studies of the Surface Processes Involved in the Oxidation ofn-Pentane on a (VO)2P2O7 System

López Granados, M., Coronado, J. M., Fierro, J. L. G., Cavani, F., Giuntoli, F., Trifirò, F.

Journal:

Surface and Interface Analysis

Year:

1997

Language:

english

File:

PDF, 451 KB

english, 1997

6

Effect of Photoetching on Porous Silicon Morphology

Guerrero-Lemus, R., Moreno, J. D., Martín-Palma, R. J., Martínez-Duart, J. M., Herrero, P., Marcos, M. L., González-Velasco, J., Gómez, P.

Journal:

Surface and Interface Analysis

Year:

1997

Language:

english

File:

PDF, 377 KB

english, 1997

7

Escape Probability of Signal Auger and Photoelectrons from Ultrathin Overlayers

Tilinin, I. S., Zemek, J., Hucek, S.

Journal:

Surface and Interface Analysis

Year:

1997

Language:

english

File:

PDF, 294 KB

english, 1997

8

The Excitation Depth Distribution Function for Auger Electrons Created by Electron Impact

Jablonski, A., Tougaard, S.

Journal:

Surface and Interface Analysis

Year:

1997

Language:

english

File:

PDF, 615 KB

english, 1997

9

Determination of the Ion Sputtering-induced In-depth Distribution by Means of Elastic Peak Electron Spectroscopy

Konkol, A., Menyhard, M.

Journal:

Surface and Interface Analysis

Year:

1997

Language:

english

File:

PDF, 243 KB

english, 1997

10

Calibration of the Probing Depth by Total Electron Yield of EXAFS Spectra in Oxide Overlayers (Ta2O5, TiO2, ZrO2)

Jiménez, V. M., Caballero, A., Fernández, A., Sánchez-López, J. C., González-Elipe, A. R., Trigo, J. F., Sanz, J. M.

Journal:

Surface and Interface Analysis

Year:

1997

Language:

english

File:

PDF, 371 KB

english, 1997

11

Structure of a Langmuir Film Based on the Construction of a System Response Function for the Analysis of Second Harmonic Signals

Garland, N. L., Lambrakos, S. G., Barger, W. R., Trzaskoma-Paulette, P. P.

Journal:

Surface and Interface Analysis

Year:

1997

Language:

english

File:

PDF, 460 KB

english, 1997

12

Quantitative Study of Methyl Methacrylate-Poly(Ethylene Glycol) Methacrylate Copolymer Films using High Mass Resolution ToF-SIMS

Briggs, D., Davies, M. C.

Journal:

Surface and Interface Analysis

Year:

1997

Language:

english

File:

PDF, 486 KB

english, 1997

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