Volume 26; Issue 8

Surface and Interface Analysis

Volume 26; Issue 8

1

Application of low-energy noble-gas ion scattering to the quantitative surface compositional analysis of binary alloys and metal oxides

van den Oetelaar, L. C. A., van Benthem, H. E., Helwegen, J. H. J. M., Stapel, P. J. A., Brongersma, H. H.

Journal:

Surface and Interface Analysis

Year:

1998

Language:

english

File:

PDF, 488 KB

english, 1998

2

Determination of the concentration of surface hydroxyl groups on metal oxide films by a quantitative XPS method

McCafferty, E., Wightman, J. P.

Journal:

Surface and Interface Analysis

Year:

1998

Language:

english

File:

PDF, 390 KB

english, 1998

3

X-ray and UV valence band photoemission of carbon films

Calliari, L., Laidani, N., Speranza, G.

Journal:

Surface and Interface Analysis

Year:

1998

Language:

english

File:

PDF, 165 KB

english, 1998

4

Static SIMS spectra of polystyrene obtained by ‘living’ radical polymerization. Part I: Molecular weight-dependent fragmentation

Vanden Eynde, X., Matyjaszewski, K., Bertrand, P.

Journal:

Surface and Interface Analysis

Year:

1998

Language:

english

File:

PDF, 332 KB

english, 1998

5

Static SIMS spectra of polystyrene obtained by ‘living’ radical polymerization. Part II: Molecular weight quantification based on end groups

Vanden Eynde, X., Bertrand, P.

Journal:

Surface and Interface Analysis

Year:

1998

Language:

english

File:

PDF, 377 KB

english, 1998

6

Self-consistent calibration of TixC1-x auger spectra

Werner, Wolfgang S. M., Schmölz, Paul J. M., Wagner, Horst W., Störi, Herbert, Kiefer, Johann

Journal:

Surface and Interface Analysis

Year:

1998

Language:

english

File:

PDF, 259 KB

english, 1998

7

Identification of LEIS contributions observed in the ion kinetic energy distributions collected on a cameca IMS-3f SIMS instrument

Franzreb, Klaus, Pratt, Allen, Splinter, Steven, van der Heide, Paul

Journal:

Surface and Interface Analysis

Year:

1998

Language:

english

File:

PDF, 317 KB

english, 1998

8

Energy calibration of X-ray photoelectron spectrometers. Part III: Location of the zero point on the binding-energy scale

Miller, A. C., Powell, C. J., Gelius, U., Anderson, C. R.

Journal:

Surface and Interface Analysis

Year:

1998

Language:

english

File:

PDF, 233 KB

english, 1998

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