Volume 27; Issue 10

Surface and Interface Analysis

Volume 27; Issue 10

1

Atomic force microscopy and high-resolution RBS investigation of the surface modification of magnetron sputter-etched Si(111) in an argon plasma at different pressures

Deenapanray, P. N. K., Hillie, K. T., Demanet, C. M., Ridgway, M. C.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 353 KB

english, 1999

2

Surface chemistry of bromobutyl binary blends

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 127 KB

english, 1999

3

Combined ultrahigh vacuum-electrochemistry study of aniline oxidation at oxidized polycrystalline nickel

Seshadri, G., Sarid, R. M., Kelber, J. A.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 125 KB

english, 1999

4

Demonstration of 3D resolved element analysis of material surfaces by laser post-ionization of sputtered neutrals

Müller, U., Schittenhelm, M., Schmittgens, R., Helm, H.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 346 KB

english, 1999

5

XPS characterization of carbon-coated alumina support

Plyuto, Igor V., Shpak, Anatoliy P., Babich, Igor V., Plyuto, Yuri V., Sharanda, Lyudmila F., Stoch, Jerzy, Moulijn, Jacob A.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 88 KB

english, 1999

6

Characterization of adsorption sites on a quartz powder from ESCA analysis of an adsorbed fatty diamine

Ernstsson, Marie, Claesson, Per M., Shao, Sten Y.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 263 KB

english, 1999

7

Availability of layered certified reference materials for industrial application of glow discharge spectrometric depth profiling

Winchester, R. Michael, Beck, Uwe

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 108 KB

english, 1999

8

XPS study of the dehydration of clay and kaolin powders

Wittberg, T. N., Wang, Pu Sen

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 77 KB

english, 1999

9

XPS analysis and microstructural characterization of a Ce/Tb mixed oxide supported on a lanthana-modified transition alumina

Galtayries, A., Blanco, G., Cifredo, G. A., Finol, D., Gatica, J. M., Pintado, J. M., Vidal, H., Sporken, R., Bernal, S.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 452 KB

english, 1999

10

Non-uniform sputtering and degradation of depth resolution during GDOES depth profiling analysis of thin anodic alumina films grown over rough substrates

Shimizu, K., Habazaki, H., Skeldon, P., Thompson, G. E., Wood, G. C.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 529 KB

english, 1999

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