Volume 27; Issue 7

Surface and Interface Analysis

Volume 27; Issue 7

1

Combined ToF-SIMS/XPS study of plasma modification and metallization of polyimide

Wolany, D., Fladung, T., Duda, L., Lee, J. W., Gantenfort, T., Wiedmann, L., Benninghoven, A.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 182 KB

english, 1999

2

Application of parallel factor analysis and x-ray photoelectron spectroscopy to the initial stages in oxidation of aluminium. I. The Al 2p photoelectron line

Do, T., McIntyre, N. S., Harshman, R. A., Lundy, M. E., Splinter, S. J.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 229 KB

english, 1999

3

Structure and physicochemistry of anodic oxide films on titanium and TA6V alloy

Zwilling, V., Darque-Ceretti, E., Boutry-Forveille, A., David, D., Perrin, M. Y., Aucouturier, M.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 584 KB

english, 1999

4

Analysis of the transition layer in silicon nitride films deposited by a low-pressure chemical vapour deposition

Tanaka, Koki, Tsuge, Atsuko, Takiyama, Makoto, Shimizu, Ryuichi

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 246 KB

english, 1999

5

In situ measurement of lithium movement in thin film electrochromic coatings using cold neutron depth profiling

Lamaze, G. P., Chen-Mayer, H., Badding, M., Laby, L.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 135 KB

english, 1999

6

In vivo characterization of the interface between cortical bone and biphasic calcium phosphate by the PIXE method

Jallot, E., Irigaray, J. L., Weber, G., Frayssinet, P.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 321 KB

english, 1999

7

Characterization of polyethylene surfaces heated after plasma fluorination

Jama, C., Quensierre, J.-D., Gengembre, L., Moineau, V., Grimblot, J., Dessaux, O., Goudmand, P.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 160 KB

english, 1999

8

Stereoregular polypropylenes studied by time-of-flight secondary ion mass spectrometry (ToF-SIMS) and atomic force microscopy (AFM)

Xu, Keyang, Gusev, Arkady I., Hercules, David M.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 424 KB

english, 1999

9

Surface roughness of sputter-deposited gold films: a combined x-ray technique and AFM study

Schug, C., Schempp, S., Lamparter, P., Steeb, S.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 255 KB

english, 1999

10

Study of low energy high dose nitrogen implantation in aluminium, iron, copper and gold

Sanghera, H. K., Sullivan, J. L.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 248 KB

english, 1999

11

Summary of ISO/TC 201 standards: introduction

Powell, C. J., Shimizu, R.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 24 KB

english, 1999

12

Summary of ISO/TC 201 standard: I ISO 14976:1998—surface chemical analysis —data transfer format

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 30 KB

english, 1999