Volume 27; Issue 8

Surface and Interface Analysis

Volume 27; Issue 8

1

Editorial

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 5 KB

english, 1999

2

Surface studies of (111) facets of cBN mini-crystals

Lau, W. M., Chen, D., Song, Z. Z., McIntyre, N. S., Deng, Z. W., Kwok, R. W. M.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 134 KB

english, 1999

3

Adhesive bonding of hot-dipped galvanized steel: use of ToF-SIMS for forensic analysis of failed joints

Fitzpatrick, M. F., Watts, J. F.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 488 KB

english, 1999

4

Substrate photoelectron enhancement of carbonaceous overlayer Auger emission: effect of the substrate on carbon overlayer thickness determination in XPS

Brizzolara, Robert A., Beard, Bruce C.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 156 KB

english, 1999

5

XPS investigation of the electronic environment in selected heterogenized zirconocene catalysts

Atiqullah, M., Faiz, M., Akhtar, M. N., Salim, M. A., Ahmed, S., Khan, J. H.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 109 KB

english, 1999

6

Surface characterization of polypropylene/(ethylene-propylene) copolymer blends (PP/EP): application to injection-moulded systems

Tomasetti, E., Nysten, B., Rouxhet, P. G., Poleunis, C., Bertrand, P., Legras, R.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 340 KB

english, 1999

7

Development of a standard method for quantitative depth profile analysis of zinc-based metallic coatings by direct current glow discharge optical emission spectroscopy

Bengtson, Arne, Hänström, Sofia, Lo Piccolo, Eugenio, Zacchetti, Nicoletta, Meilland, Raymond, Hocquaux, Hubert

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 364 KB

english, 1999

8

Substrate-related feature in the loss structure of contamination C 1s

Castle, J. E., Salvi, A. M., Guascito, M. R.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 131 KB

english, 1999

9

New method to correct for the influence of organic contamination on intensity ratios in quantitative XPS

Vereecke, G., Rouxhet, P. G.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 150 KB

english, 1999

10

Atomic force microscopy imaging of chloride ions adsorbed on etched polycrystalline copper in dilute HCl

Castle, J. E., Zhdan, P. A., Singjai, P.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 609 KB

english, 1999

11

Oxygen adsorption and reaction on alpha-silicon

Nagatomi, T., Harada, Y., Niwa, M., Takai, Y., Shimizu, R.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 262 KB

english, 1999

12

Application of self-organizing maps (SOM) to Auger electron spectroscopy (AES)

Tokutaka, H., Yoshihara, K., Fujimura, K., Iwamoto, K., Obu-Cann, K.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 333 KB

english, 1999

13

Ion extraction from insulating fibers in ToF-SIMS

Avci, Recep, Hagenston, Anna M., Equall, Nancy L., Groenewold, Gary S., Gresham, Gary L., Dahl, David A.

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 363 KB

english, 1999

14

Corrigendum

Avci, Recep, Hagenston, Anna M., Equall, Nancy L., Groenewold, Gary S., Gresham, Gary L., Dahl, David A.

Journal:

Surface and Interface Analysis

Year:

1999

File:

PDF, 8 KB

1999

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