Volume 33; Issue 12

Surface and Interface Analysis

Volume 33; Issue 12
4

XPS analysis of FIB-milled Si

Year:
2002
Language:
english
File:
PDF, 331 KB
english, 2002
5

Resolution parameters for model functions used in surface analysis

Year:
2002
Language:
english
File:
PDF, 112 KB
english, 2002
10

Ultrathin SiO2 on Si: III mapping the layer thickness efficiently by XPS

Year:
2002
Language:
english
File:
PDF, 682 KB
english, 2002