Volume 33; Issue 4

Surface and Interface Analysis

Volume 33; Issue 4

1

Surface chemistry of the iron tetraazamacrocycle on the aminopropyl-modified surface of oxidized n-Si(100) by AFM and XPS

Janildo L. Magalhães, Leonardo M. Moreira, Ubirajara P. Rodrigues-Filho, Martha J. Giz, Marcelo A. Pereira-da-Silva, Richard Landers, Rita C. G. Vinhas, Pedro A. P. Nascente

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 194 KB

english, 2002

2

Interactions of CO2 and CO at fractional atmosphere pressures with iron and iron oxide surfaces: one possible mechanism for surface contamination?

D. J. Miller, M. C. Biesinger, N. S. McIntyre

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 235 KB

english, 2002

3

Auger depth profiling of heat-treated Au/Ni thin films

Ahmed M. Abdul-Lettif

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 127 KB

english, 2002

4

Summary of ISO/TC 201 Standard: II ISO 14237:2000—Surface chemical analysis—Secondary ion mass spectrometry—Determination of boron atomic concentration in silicon using uniformly doped materials

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 60 KB

english, 2002

5

Summary of ISO/TC 201 Standard: III ISO 14707:2000—Surface chemical analysis—Glow discharge spectrometry—Glow discharge optical emission spectrometry—Introduction for use

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 57 KB

english, 2002

6

Summary of ISO/TC 201 Standard: IV ISO 14606:2000—Surface chemical analysis—Sputter depth profiling—Optimization using layered systems as reference materials

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 58 KB

english, 2002

7

Summary of ISO/TC 201 Standard: V ISO 14975:2000—Surface chemical analysis—Data information formats

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 63 KB

english, 2002

8

Summary of ISO/TC 201 Standard: VI ISO 14706:2000—Surface chemical analysis—Determination of surface elemental contamination on silicon wafers by total reflection x-ray fluorescence (TXRF) spectroscopy

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 65 KB

english, 2002

9

Adsorption of alginic acid to titanium investigated using x-ray photoelectron spectroscopy and atomic force microscopy

Robert A. Brizzolara

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 306 KB

english, 2002

10

Surface cleaning and characterization of yttria-stabilized zirconia

M. de Ridder, R. G. van Welzenis, H. H. Brongersma

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 193 KB

english, 2002

11

Detachment of alumina films from aluminium by 100 keV H+ ions

Y. Liu, M. Alexander, E. Koroleva, P. Skeldon, G. E. Thompson, P. Bailey, T. C. Q. Noakes, K. Shimizu, H. Habazaki

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 223 KB

english, 2002

12

Thermochemical surface treatment of iron–silicon and iron–manganese alloys

X. Vanden Eynde, J.-P. Servais, M. Lamberigts

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 238 KB

english, 2002

13

XPS study of the changes during the service life of polyester powder coatings

R. G. Haverkamp, D. C. W. Siew, T. F. Barton

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 127 KB

english, 2002

14

Surface physicochemistry of corona-discharge-treated polypropylene film

Lesley-Ann O'Hare, Stuart Leadley, Bhukan Parbhoo

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 274 KB

english, 2002

15

XPS and SEM characterization of wheel/workpiece interface in grinding of superalloy

Xipeng Xu, Yiqing Yu

Journal:

Surface and Interface Analysis

Year:

2002

Language:

english

File:

PDF, 347 KB

english, 2002