Volume 36; Issue 7

Surface and Interface Analysis

Volume 36; Issue 7

1

X-ray photoelectron microscopic imaging of the chemical bonding state of Si in a rock sample

H. Seyama, D. Wang, M. Soma

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 245 KB

english, 2004

2

In situ UV–visible and IR absorption study of the aggregation of silver colloidal particles via chemisorption of octadecanethiol

T. Wadayama, H. Yano, Y. Sasaki, J. Takahashi, A. Hatta

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 238 KB

english, 2004

3

XPS analysis with external bias: a simple method for probing differential charging

Gulay Ertas, Sefik Suzer

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 170 KB

english, 2004

4

XPS and AES characterization of hydrolysed γ-mercaptopropyltrimethoxysilane deposited on Al, Zn and Al–43.4Zn–1.6Si alloy-coated steel

Ulf Bexell, Mikael Grehk, Mikael Olsson, Ulrik Gelius

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 390 KB

english, 2004

5

Use of QUASES™/XPS measurements to determine the oxide composition and thickness on an iron substrate

A. P. Grosvenor, B. A. Kobe, N. S. McIntyre, S. Tougaard, W. N. Lennard

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 430 KB

english, 2004

6

In situ XPS and SIMS analysis of O2+ beam-induced silicon oxidation

S. K. Tan, K. L. Yeo, A. T. S. Wee

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 182 KB

english, 2004

7

Quantitative analyses of impurities in ZnO

Isao Sakaguchi, Syunichi Hishita

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 151 KB

english, 2004

8

Summary of ISO/TC 201 Technical Report: ISO/TR 19319: 2003—Surface chemical analysis—Auger electron spectroscopy and x-ray photoelectron spectroscopy—Determination of lateral resolution, analysis area and sample area viewed by the analyser

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 60 KB

english, 2004

9

Mechanical properties of the Ni filler metal layer in Si3N4 joints measured by nanoindentation

P. Miranzo, M. I. Osendi, I. Vergara

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 168 KB

english, 2004

10

Photoelectron core levels for enargite, Cu3AsS4

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 329 KB

english, 2004

11

X-ray microanalysis in STEM of short-term physicochemical reactions at bioactive glass particle/biological fluid interface. Determination of O/Si atomic ratios

V. Banchet, E. Jallot, J. Michel, L. Wortham, D. Laurent-Maquin, G. Balossier

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 254 KB

english, 2004