Volume 43; Issue 9

Surface and Interface Analysis

Volume 43; Issue 9

1

The initial oxidation of polycrystalline thorium

M. Bagge-Hansen, R. A. Outlaw, M. Y. Zhu, D. M. Manos

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 344 KB

english, 2011

2

Microstructure analysis of sol-gel-derived nanocrystalline ITO thin films

Ying Li, Gaoyang Zhao, Yang Ren, Dichun Chen

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 267 KB

english, 2011

3

Infrared spectroscopic ellipsometry (IRSE) and X-ray photoelectron spectroscopy (XPS) monitoring the preparation of maleimide-functionalized surfaces: from Au towards Si (111)

Guoguang Sun, Marc Hovestädt, Xin Zhang, Karsten Hinrichs, Dana Maria Rosu, Iver Lauermann, Claudia Zielke, Antje Vollmer, Heike Löchel, Bernhard Ay, Hermann-Georg Holzhütter, Ulrich Schade, Norbert E

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 421 KB

english, 2011

4

Investigation of a-Si (N+)/c-Si (P) hetero-junction solar cell through AFORS-HET simulation

J. Q. Wang, F. Y. Meng, Z. D. Fang, Q. H. Ye

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 387 KB

english, 2011

5

Effects of negative bias on the structural, topological and tribological properties of amorphous carbon films prepared by magnetron sputtering

Zhou Wang, Chengbing Wang, Bin Zhang, Qi Wang, Junyan Zhang

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 335 KB

english, 2011

6

Analysis of thin films and molecular orientation using cluster SIMS

Felicia M. Green, Martin P. Seah, Ian S. Gilmore, Tara L. Salter, Steve J. Spencer

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 253 KB

english, 2011

7

Characterization of sugar juice heat exchanger tube deposit

C. P. East, W. O. S. Doherty, C. M. Fellows, H. Yu

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 737 KB

english, 2011

8

VAMAS interlaboratory study on organic depth profiling

A. G. Shard, S. Ray, M. P. Seah, L. Yang

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 357 KB

english, 2011

9

Electrical, structural and morphological characteristics of rapidly annealed Ni/Pd Schottky rectifiers on n-type GaN

M. Siva Pratap Reddy, V. Rajagopal Reddy, I. Jyothi, Chel-Jong Choi

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 425 KB

english, 2011

10

Isoelectric points of plasma-modified and aged silicon oxynitride surfaces measured using contact angle titrations

Kristina J. Trevino, Jeffrey C. Shearer, Patrick R. McCurdy, Shannon E. Pease-Dodson, Christabel C. Okegbe, Ellen R. Fisher

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 678 KB

english, 2011

11

Study on 172-nm vacuum ultraviolet light surface modifications of polydimethylsiloxane for micro/nanofluidic applications

Takatoki Yamamoto

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 293 KB

english, 2011

12

Interface Science, Passion and Impact

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 49 KB

english, 2011

13

Science, Fascination, and Passion

Heinrich Rohrer

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 44 KB

english, 2011