Volume 56; Issue 3

Technometrics

Volume 56; Issue 3
1

Case-Deletion Diagnostics for Linear Mixed Models

Pan, Jianxin, Fei, Yu, Foster, Peter
Journal:
Technometrics
Year:
2014
Language:
english
File:
PDF, 252 KB
english, 2014
2

The Inverse Gaussian Process as a Degradation Model

Ye, Zhi-Sheng, Chen, Nan
Journal:
Technometrics
Year:
2014
Language:
english
File:
PDF, 242 KB
english, 2014
4

Surrogate Modeling of Computer Experiments With Different Mesh Densities

Tuo, Rui, Wu, C. F. Jeff, Yu, Dan
Journal:
Technometrics
Year:
2014
Language:
english
File:
PDF, 289 KB
english, 2014
5

Pointwise and Simultaneous Tolerance Limits Under Logistic Regression

Zimmer, Zachary, Park, DoHwan, Mathew, Thomas
Journal:
Technometrics
Year:
2014
Language:
english
File:
PDF, 243 KB
english, 2014
6

A Piecewise Single-Index Model for Dimension Reduction

Wang, Tianhao, Xia, Yingcun
Journal:
Technometrics
Year:
2014
Language:
english
File:
PDF, 587 KB
english, 2014
7

Book Reviews

Journal:
Technometrics
Year:
2014
Language:
english
File:
PDF, 162 KB
english, 2014
8

A Test of Stationarity for Textured Images

Taylor, Sarah L., Eckley, Idris A., Nunes, Matthew A.
Journal:
Technometrics
Year:
2014
Language:
english
File:
PDF, 767 KB
english, 2014
9

A Bayesian Nonparametric Test for Minimal Repair

Li, Li, Hanson, Timothy, Damien, Paul, Popova, Elmira
Journal:
Technometrics
Year:
2014
Language:
english
File:
PDF, 811 KB
english, 2014
12

Statistical Process Control Using a Dynamic Sampling Scheme

Li, Zhonghua, Qiu, Peihua
Journal:
Technometrics
Year:
2014
Language:
english
File:
PDF, 433 KB
english, 2014
13

Time-Between-Event Control Charts for Sampling Inspection

Qu, Liang, Wu, Zhang, Khoo, Michael B. C., Rahim, Abdur
Journal:
Technometrics
Year:
2014
Language:
english
File:
PDF, 317 KB
english, 2014
14

2013 Ziegel Award Announcement

Journal:
Technometrics
Year:
2014
Language:
english
File:
PDF, 37 KB
english, 2014