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Volume 89; Issue 1
Main
The European Physical Journal Applied Physics
Volume 89; Issue 1
The European Physical Journal Applied Physics
Volume 89; Issue 1
1
Study of nanocrystalline silicon-germanium for the development of thin film transistors
Torres, Arturo
,
Moreno, Mario
,
Rosales, Pedro
,
Dominguez, Miguel
,
Torres, Alfonso
,
Morales, Alfredo
,
Itzmoyotl, Adrian
,
de la Hidalga, Javier
,
Kleider, Jean-Paul
,
Johnson, Erik
,
Brüggemann, Rudolf
Journal:
The European Physical Journal Applied Physics
Year:
2020
File:
PDF, 930 KB
Your tags:
2020
2
Si surface passivation by using triode-type plasma-enhanced chemical vapor deposition with thermally energized film-precursors
Niikura, Chisato
,
Shiratori, Yuta
,
Miyajima, Shinsuke
,
Kleider, Jean-Paul
,
Johnson, Erik
,
Brüggemann, Rudolf
Journal:
The European Physical Journal Applied Physics
Year:
2020
File:
PDF, 1023 KB
Your tags:
2020
3
Defect absorption in selenium films by photothermal deflection spectroscopy
Gotoh, Tamihiro
,
Kleider, Jean-Paul
,
Johnson, Erik
,
Brüggemann, Rudolf
Journal:
The European Physical Journal Applied Physics
Year:
2020
File:
PDF, 664 KB
Your tags:
2020
4
Investigation on the luminescent stability in amorphous silicon oxynitride systems
Zhang, Pengzhan
,
Wang, Sake
,
Chen, Kunji
,
Wu, Xinglong
,
Kleider, Jean-Paul
,
Johnson, Erik
,
Brüggemann, Rudolf
Journal:
The European Physical Journal Applied Physics
Year:
2020
File:
PDF, 757 KB
Your tags:
2020
5
The strain induced type-II band re-alignment of blue phosphorus-GeX (Xâ=âC/H/Se) heterostructures
Li, Honglin
,
Cui, Yuting
,
Luo, Haijun
,
Li, Wanjun
Journal:
The European Physical Journal Applied Physics
Year:
2020
File:
PDF, 3.73 MB
Your tags:
2020
6
SEM, EDX spectroscopy and real-time optical microscopy of electroformed silicon nitride-based light emitting memory device
Anutgan, Mustafa
,
Anutgan, Tamila
,
Atilgan, Ismail
,
Kleider, Jean-Paul
,
Johnson, Erik
,
Brüggemann, Rudolf
Journal:
The European Physical Journal Applied Physics
Year:
2020
File:
PDF, 3.82 MB
Your tags:
2020
7
The fast computation of eddy current distribution and probe response in homogenized composite material based on semi-analytical approach
Chebbi, Houssem
,
Prémel, Denis
Journal:
The European Physical Journal Applied Physics
Year:
2020
File:
PDF, 4.42 MB
Your tags:
2020
1
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