Volume 106; Issue 4

Thin Solid Films

Volume 106; Issue 4
1

Electrical properties of thin metal films

Journal:
Thin Solid Films
Year:
1983
Language:
english
File:
PDF, 33 KB
english, 1983
2

The role of field emission in submicron electron beam testing

L.W. Swanson, D. Tuggle, Jia-Zheng Li
Journal:
Thin Solid Films
Year:
1983
Language:
english
File:
PDF, 964 KB
english, 1983
3

Non-equilibrium carrier relaxation in sprayed CdSe films

A.K. Raturi, R. Thangaraj, P.Raja Ram, B.B. Tripathi, O.P. Agnihotri
Journal:
Thin Solid Films
Year:
1983
Language:
english
File:
PDF, 327 KB
english, 1983
4

Electrical properties of glow discharge amorphous SiNx: H thin films

Hideo Watanabe, Kazuhisa Katoh, Masaru Yasui
Journal:
Thin Solid Films
Year:
1983
Language:
english
File:
PDF, 583 KB
english, 1983
6

Light scattering of dielectric single layers depending on their thickness

H.G. Walther, G. Schirmer
Journal:
Thin Solid Films
Year:
1983
Language:
english
File:
PDF, 335 KB
english, 1983
8

Effects of nitrogen on the electrical properties of sputtered SiCx films

Takeshi Nagai, Kazushi Yamamoto, Ikuo Kobayashi
Journal:
Thin Solid Films
Year:
1983
Language:
english
File:
PDF, 334 KB
english, 1983
10

The resistivity of thin metal films—Some critical remarks

J.R. Sambles
Journal:
Thin Solid Films
Year:
1983
Language:
english
File:
PDF, 644 KB
english, 1983
11

Author index

Journal:
Thin Solid Films
Year:
1983
File:
PDF, 27 KB
1983
12

Contents of volume 106

Journal:
Thin Solid Films
Year:
1983
Language:
english
File:
PDF, 73 KB
english, 1983
14

Influence of the surface structure on the adsorption of oxygen and carbon monoxide on palladium

B.E. Nieuwenhuys, G.A. Kok
Journal:
Thin Solid Films
Year:
1983
Language:
english
File:
PDF, 198 KB
english, 1983