Volume 13; Issue 1

Thin Solid Films

Volume 13; Issue 1
1

Electron trapping in thin SiO2 films due to avalanche currents

Year:
1972
Language:
english
File:
PDF, 241 KB
english, 1972
2

The role of HCl in the passivation of MOS structures

Year:
1972
Language:
english
File:
PDF, 212 KB
english, 1972
3

The thin film MIS surface photodiode

Year:
1972
Language:
english
File:
PDF, 307 KB
english, 1972
4

The development of a thin film transistor amplifier

Year:
1972
Language:
english
File:
PDF, 219 KB
english, 1972
5

Positive flat band voltages measured on MIS diodes consisting of evaporated CdS films

Year:
1972
Language:
english
File:
PDF, 213 KB
english, 1972
6

Study of metal-organic monolayer-semiconductor structures

Year:
1972
Language:
english
File:
PDF, 288 KB
english, 1972
7

Preparation and properties of beam crossovers for interconnections in thin film circuits

Year:
1972
Language:
english
File:
PDF, 230 KB
english, 1972
8

The electrical conductivity of thin metal films at low temperatures

Year:
1972
Language:
english
File:
PDF, 227 KB
english, 1972
9

Mechanism of noise formation in electric conduction in thin metal films

Year:
1972
Language:
english
File:
PDF, 231 KB
english, 1972
13

Structural and electrical properties of pyrolytically deposited carmet films

Year:
1972
Language:
english
File:
PDF, 275 KB
english, 1972
16

Thin films in vacuum ultraviolet spectroscopy

Year:
1972
Language:
english
File:
PDF, 692 KB
english, 1972
17

Charge effects in thin film adhesion

Year:
1972
Language:
english
File:
PDF, 253 KB
english, 1972
18

Mass transport in layered polycrystalline thin films

Year:
1972
Language:
english
File:
PDF, 233 KB
english, 1972
19

Observations on the electromigration in various thin films of group I–IV

Year:
1972
Language:
english
File:
PDF, 167 KB
english, 1972
21

Detection of nitrogen atoms by means of thin silver films

Year:
1972
Language:
english
File:
PDF, 170 KB
english, 1972
22

The effect of gas adsorption on the conductivity of thin metal films

Year:
1972
Language:
english
File:
PDF, 254 KB
english, 1972
23

Some properties of amorphous mercury selenide films

Year:
1972
Language:
english
File:
PDF, 43 KB
english, 1972
25

The crystallization and decomposition on InSe thin films

Year:
1972
Language:
english
File:
PDF, 330 KB
english, 1972
26

Dislocations and the magnetic structure in Ne, Fe and Ni-Fe (100) single crystal films

Year:
1972
Language:
english
File:
PDF, 375 KB
english, 1972
27

Editorial Board

Year:
1972
Language:
english
File:
PDF, 44 KB
english, 1972
28

Charge trapping in MOS systems

Year:
1972
Language:
english
File:
PDF, 170 KB
english, 1972
30

Influence of scattering mechanisms on the transconductance of CdSe thin film transistors

Year:
1972
Language:
english
File:
PDF, 169 KB
english, 1972
31

Electrical resistivity of epitaxial titanium films

Year:
1972
Language:
english
File:
PDF, 269 KB
english, 1972
32

Photo-injection of electrons from metal films into single-crystal Al2O3 layers

Year:
1972
Language:
english
File:
PDF, 294 KB
english, 1972
33

Some effects of strain and temperature on the resistance of thin gold-glass cermet films

Year:
1972
Language:
english
File:
PDF, 451 KB
english, 1972
34

Electromigration and crevice formation in thin metallic films

Year:
1972
Language:
english
File:
PDF, 739 KB
english, 1972
35

Quantitative measurements of the mass distribution in thin films during electrotransport experiments

Year:
1972
Language:
english
File:
PDF, 259 KB
english, 1972
36

Radio frequency dielectric dissipation measurements on yttrium oxide thin films

Year:
1972
Language:
english
File:
PDF, 188 KB
english, 1972
37

A study of dielectric loss mechanisms in zinc sulphide thin film capacitors

Year:
1972
Language:
english
File:
PDF, 533 KB
english, 1972
38

Properties of polymer thin films on silicon

Year:
1972
Language:
english
File:
PDF, 233 KB
english, 1972
39

Interface properties of r.f. sputtered dielectric films in MIS capacitors

Year:
1972
Language:
english
File:
PDF, 305 KB
english, 1972
40

Comparison of step and ramp voltage breakdown tests in aluminum oxide films

Year:
1972
Language:
english
File:
PDF, 229 KB
english, 1972