Volume 131; Issue 3-4

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Thin Solid Films
Volume 131; Issue 3-4

Thin Solid Films

Volume 131; Issue 3-4

1

Yoke length optimization of a three-region thin film recording head

P. Ciureanu, G. Korony, C. Papusoi

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 580 KB

english, 1985

2

Electrical properties of n-n ZnSe/GaAs heterojunctions

E.J. Bawolek, B.W. Wessels

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 667 KB

english, 1985

3

Influence des conditions de préparation sur les propriétés électriques des couches minces polycristallines de bismuth

C. Butto, J. Berty

Journal:

Thin Solid Films

Year:

1985

File:

PDF, 1.11 MB

1985

4

Effects of ambient gas on the diffusion of copper through thin chromium films and of nickel through thin gold films

S.K. Ray, R.K. Lewis

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 432 KB

english, 1985

5

The deposition characteristics and the structural nature of the deposit in the chemical vapour deposition of boron

C.S. Park, J.S. Yoo, J.S. Chun

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 1.46 MB

english, 1985

6

Thermal oxidation of the silicides CoSi2, CrSi2, NiSi2, PtSi, TiSi2 and ZrSi2

W.J. Strydom, J.C. Lombaard, R. Pretorius

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 1.06 MB

english, 1985

7

The effects of different implantation and annealing temperatures on the structural and chemical properties of high dose oxygen-ion-implanted silicon

C.G. Tuppen, M.R. Taylor, P.L.F. Hemment, R.P. Arrowsmith

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 2.36 MB

english, 1985

8

Dual-ion-beam deposition of carbon films with diamond-like properties

Michael J. Mirtich, Diane M. Swec, John C. Angus

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 745 KB

english, 1985

9

A preliminary electron spectroscopy for chemical analysis investigation of the plasma copolymerization of tetramethyltin and perfluorobenzene

H.S. Munro, C. Till

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 389 KB

english, 1985

10

An investigation of the structure of Nb/Si composite films formed by electron beam evaporation

M. Denhoff, B. Heinrich, A.E. Curzon, S. Gygax

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 361 KB

english, 1985

11

Structural properties of epitaxial layers of CdTe, ZnCdTe and HgCdTe

J.H. Dinan, S.B. Qadri

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 913 KB

english, 1985

12

Dissolution of anodic Ta2O5 layers into polycrystalline tantalum

J. Giber, H. Oechsner

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 542 KB

english, 1985

13

Structure and adhesion of vapour deposits, partially ionized vapour deposits, cluster deposits and partially ionized cluster deposits

E.I. Tochitsky, R.N. Gritskevich, V.E. Obukhov

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 1.35 MB

english, 1985

14

Stability and degradation of thin silver films vacuum evaporated onto alkali halide substrates

M.I. Bîrjega, R.M. Bîrjega, N. Popescu-Pogrion

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 1.43 MB

english, 1985

15

Ti-Nx compounds deposited at low temperature: General aspects of their phase composition

I.N. Martev, G.I. Grigorov, I.G. Petrov, E. Dynowska

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 505 KB

english, 1985

16

Influence of two-dimensional melting on multiple- beam interferometry reflection during the oxidation of aluminium thin films

S. Lugomer, M. Stipančić

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 372 KB

english, 1985

17

Differential negative resistance in metal/insulator/metal structures with an upper bilayer electrode

J.C. Bernede, T. Abachi

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 388 KB

english, 1985

18

Calibration method for an oscillating quartz crystal thickness monitor

J. Graham, L.H. Peirce

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 176 KB

english, 1985

19

Growth of crystalline semiconductor materials on crystal surfaces: by Leonid M. Alexandrov; published by Elsevier, Amsterdam, 1984; 318 pp.; price, U.S.$ 102, Dfl. 265.00

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 76 KB

english, 1985

20

Ion mixing and surface layer alloying—recent advances: edited by M.-A. Nicolet and S.T. Picraux; published by Noyes, Park Ridge, NJ; 162 pp.; price, U.S.$ 32.00

Jorge J. Santiago

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 151 KB

english, 1985

21

Author index

Journal:

Thin Solid Films

Year:

1985

File:

PDF, 49 KB

1985

22

Contents of vol. 131

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 142 KB

english, 1985