Volume 379; Issue 1-2

Thin Solid Films

Volume 379; Issue 1-2
1

Characterization and fabrication of ZnSe epilayer on porous silicon substrate

Year:
2000
Language:
english
File:
PDF, 344 KB
english, 2000
4

Sensitivity analysis of ellipsometry applied to uniaxial optical films

Year:
2000
Language:
english
File:
PDF, 504 KB
english, 2000
5

Electrical characteristics of W/P3MT/Pt diodes

Year:
2000
Language:
english
File:
PDF, 312 KB
english, 2000
6

Piezoelectric films for 100-MHz ultrasonic transducers

Year:
2000
Language:
english
File:
PDF, 399 KB
english, 2000
9

A study of structure and mixing at the interface between Fe and AlGaAs (100)

Year:
2000
Language:
english
File:
PDF, 714 KB
english, 2000
11

Deposition of (Ti, Al)N films by filtered cathodic vacuum arc

Year:
2000
Language:
english
File:
PDF, 272 KB
english, 2000
16

Abrasion and dissolution interaction of Al in a phosphoric acid solution

Year:
2000
Language:
english
File:
PDF, 311 KB
english, 2000
18

Oxidation of phosphated iron powders

Year:
2000
Language:
english
File:
PDF, 460 KB
english, 2000
19

Thermal stability of Mo/SiO2 multilayers

Year:
2000
Language:
english
File:
PDF, 622 KB
english, 2000
29

Low temperature process for nano-structure formation with Si films

Year:
2000
Language:
english
File:
PDF, 992 KB
english, 2000
30

Promoted hydroxyapatite nucleation on titanium ion-implanted with sodium

Year:
2000
Language:
english
File:
PDF, 494 KB
english, 2000
33

Extraordinary damping of Ni–Ti double layer films

Year:
2000
Language:
english
File:
PDF, 97 KB
english, 2000
35

A low reflectivity multilayer cathode for organic light-emitting diodes

Year:
2000
Language:
english
File:
PDF, 258 KB
english, 2000
38

Randomly oriented Bi4Ti3O12 thin films derived from a hybrid sol–gel process

Year:
2000
Language:
english
File:
PDF, 351 KB
english, 2000
40

PZT thin films with preferred-orientation induced by external stress

Year:
2000
Language:
english
File:
PDF, 234 KB
english, 2000
41

The growth of CoSi2 through an oxide layer: dependence on Si(100) surface structure

Year:
2000
Language:
english
File:
PDF, 1.46 MB
english, 2000
43

Gas permeability of Langmuir–Blodgett (LB) films: characterisation and application

Year:
2000
Language:
english
File:
PDF, 388 KB
english, 2000
44

Additive channel-constrained metallization of high-resolution features

Year:
2000
Language:
english
File:
PDF, 2.70 MB
english, 2000
46

TEM annealing study of normal grain growth in silver thin films

Year:
2000
Language:
english
File:
PDF, 142 KB
english, 2000
47

Index

Year:
2000
File:
PDF, 35 KB
2000
48

Index

Year:
2000
Language:
english
File:
PDF, 65 KB
english, 2000