Volume 52; Issue 1

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Thin Solid Films
Volume 52; Issue 1

Thin Solid Films

Volume 52; Issue 1

1

Editorial Board

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 41 KB

english, 1978

2

Reorientation of small palladium particles during growth on an MoS2 substrate

M. Gillet, A. Renou

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 2.13 MB

english, 1978

3

Epitaxial layers of CuInSe2 on GaAs

B. Schumann, C. Georgi, A. Tempel, G. Kühn, Nguyen Van Nam, H. Neumann, W. Hörig

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 1.02 MB

english, 1978

4

An extension of the Cottey conduction model

C.R. Tellier, A.J. Tosser

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 338 KB

english, 1978

5

Experimental evidence of third harmonic variations at 77 K and at 300 K in AuPbTeAu and AuPbxSn1−xTeAu structures

A. D'Amico, V.Pericoli Ridolfini, D. Fainelli, G. Petrocco

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 197 KB

english, 1978

6

Growth kinetics of the θ phase in AlCu thin film bilayers

S.U. Campisano, E. Costanzo, F. Scaccianoce, R. Cristofolini

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 210 KB

english, 1978

7

The electron microscopy of thin V2O3 films using composite oyster grids to calibrate the microscope

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 1.33 MB

english, 1978

8

Conduction processes in anodic tantalum oxide thin films with gold counterelectrodes

S.M. Gubanski, D.M. Hughes

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 419 KB

english, 1978

9

Zur silicidbildung in dünnen Molybdän- und Wolframschichten

B. Oertel, H.J. Kurze, H. Haueisen

Journal:

Thin Solid Films

Year:

1978

File:

PDF, 293 KB

1978

10

Analyse par la série de Fourier du signal donné par un maximètre lors du contrôle de couches minces multidiélectriques

Journal:

Thin Solid Films

Year:

1978

File:

PDF, 721 KB

1978

11

A comment on some recent results on the electrical resistivity of rare earth thin films

M. Gasgnier, A.E. Curzon, N.A. Surplice

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 147 KB

english, 1978

12

The composition of vacuum-deposited EuSx films as a function of substrate temperature and deposition rate

K. Schienbein, G. Mair, K. Reichelt

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 130 KB

english, 1978

13

Electrical conduction and phase transitions in vacuum-deposited Cu2−xS films

A.C. Rastogi, Saji Salkalachen, V.G. Bhide

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 1.58 MB

english, 1978

14

The structural and electrical properties of Metglas and amorphous metal films

A. Schäfer, G. Menzel

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 2.52 MB

english, 1978

15

Some features of magnetron sputtering

Kiyotaka Wasa, Shigeru Hayakawa

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 1.30 MB

english, 1978

16

An investigation of metal-insulator-semiconductor structures with Al2O3 insulating layers obtained by electron gun evaporation

M. Le Contellec, F. Morin

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 239 KB

english, 1978

17

The electrical properties of resistive and dielectric thin films prepared by reactive sputtering from a tantalum-titanium composite target

T. Umezawa, S. Yajima, K. Matsumoto

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 337 KB

english, 1978

18

Substrate-dependent excess electrical conductivity of superconducting films of tin above the transition temperature

P.N. Dheer, Saroj Bala Kalra

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 940 KB

english, 1978

19

Transports atomique et électronique dans les alliages amorphes de nickel-bore

J. Fléchon, F.A. Kuhnast, F. Machizaud

Journal:

Thin Solid Films

Year:

1978

File:

PDF, 356 KB

1978

20

Établissement par spectrométrie Auger d'un profil de concentration dans une interface épitaxique: Cas du couple AuAg

B. Gruzza, J.M. Guglielmacci, E. Gillet

Journal:

Thin Solid Films

Year:

1978

File:

PDF, 348 KB

1978