Volume 75; Issue 4

Thin Solid Films

Volume 75; Issue 4
2

Comparative studies of the contact angle as a measure of adherence for photoresist

Tapan Kumar Gupta
Journal:
Thin Solid Films
Year:
1981
Language:
english
File:
PDF, 612 KB
english, 1981
3

Redox reactions at titanium electrodes covered with doped passive films

Wolfgang Schmickler, Ulrich Stimming
Journal:
Thin Solid Films
Year:
1981
Language:
english
File:
PDF, 535 KB
english, 1981
4

Effect of discontinuous gold films on GaAs-electrolyte contact properties

N.L. Dmitruk, G.Ya. Kolbasov, O.I. Mayeva, V.I. Poludin
Journal:
Thin Solid Films
Year:
1981
Language:
english
File:
PDF, 357 KB
english, 1981
5

Mass transfer kinetics of mixed gas adsorption in porous media

J. Czarniecki, M. Jaroniec
Journal:
Thin Solid Films
Year:
1981
Language:
english
File:
PDF, 257 KB
english, 1981
6

Error effects in the ellipsometric investigation of thin films

K. Riedling
Journal:
Thin Solid Films
Year:
1981
Language:
english
File:
PDF, 707 KB
english, 1981
7

Energy loss straggling of electrons transmitted through carbon

C.J. Tung, C.M. Kwei
Journal:
Thin Solid Films
Year:
1981
Language:
english
File:
PDF, 269 KB
english, 1981
8

Pseudomorphic behaviour and interdiffusion between palladium films and silver and gold

G.N. Burland, P.J. Dobson
Journal:
Thin Solid Films
Year:
1981
Language:
english
File:
PDF, 441 KB
english, 1981
9

Molecular processes on the semiconductor surface in the Ge-S system

S.M. Repinsky, O.I. Semyonova
Journal:
Thin Solid Films
Year:
1981
Language:
english
File:
PDF, 613 KB
english, 1981
10

Author index

Journal:
Thin Solid Films
Year:
1981
File:
PDF, 35 KB
1981
11

Determination of Young's modulus in vacuum-evaporated thin films of aluminium and silver

M. Laugier
Journal:
Thin Solid Films
Year:
1981
Language:
english
File:
PDF, 90 KB
english, 1981
12

Unusual adhesion-aging behaviour in ZnS thin films

M. Laugier
Journal:
Thin Solid Films
Year:
1981
Language:
english
File:
PDF, 79 KB
english, 1981
13

A chemically sensitive MOS element with an ultra thin dielectric film

Michał, Duszak, Andrzej Jakubowski, Waldemar Sȩkulski
Journal:
Thin Solid Films
Year:
1981
Language:
english
File:
PDF, 159 KB
english, 1981