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Volume 71; Issue 11-2004
Main
tm - Technisches Messen
Volume 71; Issue 11-2004
tm - Technisches Messen
Volume 71; Issue 11-2004
1
Entwicklung eines Fokussensors und Integration in die Nanopositionier- und Nanomessmaschine (Development of a Focus Sensor and its Integration into the Nanopositioning and Nanomeasuring Machine)
Mastylo, Rostyslav
,
Manske, Eberhard
,
Jäger, Gerd
Journal:
tm - Technisches Messen
Year:
2004
Language:
german
File:
PDF, 729 KB
Your tags:
german, 2004
2
Online-Analyse mit Lab-on-Chip-Systemen (Online Analysis with Lab-on-Chip Systems)
Herrmann, Sigrun
,
Vonau, Winfried
Journal:
tm - Technisches Messen
Year:
2004
Language:
german
File:
PDF, 579 KB
Your tags:
german, 2004
3
Schaumcharakterisierung mit optischen Messtechniken und PC-gestützter Bildverarbeitung (Foam Characterization by Optical Measuring Techniques and Computer-Aided Image Processing)
Haß, Ernst-Christoph
,
Ottensmeyer, Ralph
,
Wittstock, Arne
Journal:
tm - Technisches Messen
Year:
2004
Language:
german
File:
PDF, 761 KB
Your tags:
german, 2004
4
Geometrische Normale zur Prüfung von Konturmessgeräten (Geometrical Standards for Testing of Contour Measuring Devices)
Neugebauer, Michael
,
Jusko, Otto
,
Wäldele, Franz
,
Kedziora, Heinz-Joachim
,
Meyer, Maik
,
Volk, Raimund
Journal:
tm - Technisches Messen
Year:
2004
Language:
german
File:
PDF, 484 KB
Your tags:
german, 2004
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