Ultramicroscopy

1

A versatile double aberration-corrected, energy filtered HREM/STEM for materials science

John L. Hutchison, John M. Titchmarsh, David J.H. Cockayne, Ron C. Doole, Crispin J.D. Hetherington, Angus I. Kirkland, H. Sawada

Journal:

Ultramicroscopy

Year:

2005

Language:

english

File:

PDF, 1.12 MB

english, 2005

2

Orientation effects on indexing of electron backscatter diffraction patterns

Matthew M. Nowell, Stuart I. Wright

Journal:

Ultramicroscopy

Year:

2005

Language:

english

File:

PDF, 1.18 MB

english, 2005

3

CBED study of grain misorientations in AlGaN epilayers

S.-L. Sahonta, D. Cherns, R. Liu, F.A. Ponce, H. Amano, I. Akasaki

Journal:

Ultramicroscopy

Year:

2005

Language:

english

File:

PDF, 398 KB

english, 2005

4

Imaging and characterization of fine γ′ precipitates in a commercial nickel-base superalloy

P.M. Sarosi, G.B. Viswanathan, D. Whitis, M.J. Mills

Journal:

Ultramicroscopy

Year:

2005

Language:

english

File:

PDF, 596 KB

english, 2005

5

Prospects for aberration-free electron microscopy

H. Rose

Journal:

Ultramicroscopy

Year:

2005

Language:

english

File:

PDF, 226 KB

english, 2005

6

Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistors

Rafal E. Dunin-Borkowski, Simon B. Newcomb, Takeshi Kasama, Martha R. McCartney, Matthew Weyland, Paul A. Midgley

Journal:

Ultramicroscopy

Year:

2005

Language:

english

File:

PDF, 816 KB

english, 2005

7

IFC (Editorial Board)

Journal:

Ultramicroscopy

Year:

2005

Language:

english

File:

PDF, 356 KB

english, 2005

8

FEMMS 2003

Journal:

Ultramicroscopy

Year:

2005

File:

PDF, 192 KB

2005

9

Manuscript receipt date

Journal:

Ultramicroscopy

Year:

2005

File:

PDF, 33 KB

2005

10

Preface

Steven A. Bradley, Wayne E. King

Journal:

Ultramicroscopy

Year:

2005

Language:

english

File:

PDF, 123 KB

english, 2005

12

Dynamic profile calculation of deposition resolution by high-energy electrons in electron-beam-induced deposition

K. Mitsuishi, Z.Q. Liu, M. Shimojo, M. Han, K. Furuya

Journal:

Ultramicroscopy

Year:

2005

Language:

english

File:

PDF, 394 KB

english, 2005

13

Analysis of local orientation gradients in deformed single crystals

D.P. Field, P.B. Trivedi, S.I. Wright, M. Kumar

Journal:

Ultramicroscopy

Year:

2005

Language:

english

File:

PDF, 496 KB

english, 2005

14

Alloy liquid metal ion sources and their application in mass separated focused ion beams

L. Bischoff

Journal:

Ultramicroscopy

Year:

2005

Language:

english

File:

PDF, 394 KB

english, 2005

Volume 103; Issue 1

A versatile double aberration-corrected, energy filtered HREM/STEM for materials science

Orientation effects on indexing of electron backscatter diffraction patterns

CBED study of grain misorientations in AlGaN epilayers

Imaging and characterization of fine γ′ precipitates in a commercial nickel-base superalloy

Prospects for aberration-free electron microscopy

Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistors

IFC (Editorial Board)

FEMMS 2003

Manuscript receipt date

Contents

Preface

Dynamic profile calculation of deposition resolution by high-energy electrons in electron-beam-induced deposition

Analysis of local orientation gradients in deformed single crystals

Alloy liquid metal ion sources and their application in mass separated focused ion beams