Volume 11; Issue 2-3

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Ultramicroscopy
Volume 11; Issue 2-3

Ultramicroscopy

Volume 11; Issue 2-3

1

Foreword

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 167 KB

english, 1983

2

On the phase transition between the (7 × 7) and (1 × 1) structures of silicon (111) surface studied by reflection electron microscopy

Yasumasa Tanishiro, Kunio Takayanagi, Katsumuchi Yagi

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 1.16 MB

english, 1983

3

Analysis of surface structural defects using LEED and RHEED

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 201 KB

english, 1983

4

Surface studies with (clean) supported metal particles and clusters

Helmut R. Poppa

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 1.28 MB

english, 1983

5

High energy transmission electron diffraction and imaging studies of the silicon (111) 7 × 7 surface structure

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 747 KB

english, 1983

6

Imaging of atomic steps on ultrathin Au films by TEM

M. Klaua, H. Bethge

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 944 KB

english, 1983

7

Stem imaging and analysis of surfaces

J.M. Cowley, Z.-C. Kang

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 1.14 MB

english, 1983

8

Surface reactions and excitations

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 1015 KB

english, 1983

9

UHV-SEM studies of surface processes: Recent progress

J.A. Venebles, G.D.T. Spiller, D.J. Fathers, C.J. Harland, M. Hanbücken

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 1.69 MB

english, 1983

10

Surface imaging by scanning tunneling microscopy

G. Binnig, H. Rohrer

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 426 KB

english, 1983

11

Direct visualization of unstained nucleic acids on a metal substrate

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 1.11 MB

english, 1983

12

Reflection electron microscopy (REM) of vicinal surfaces of fcc metals

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 1.31 MB

english, 1983

13

On the measurement of surface step heights by low-loss imaging in stem

M.M.J. Treacy, J. Bellessa

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 952 KB

english, 1983

14

Elementary surface excitations and electron energy loss spectroscopy

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 637 KB

english, 1983

15

Electron- and photon-stimulated desorption: Benefits and pitfalls

Theodore E. Madey, D.L. Doering, E. Bertel, R. Stockbauer

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 1.03 MB

english, 1983

16

Work function measurements and their relation to modern surface analysis techniques

G.A. Haas, R.E. Thomas, A. Shih, C.R.K. Marrian

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 813 KB

english, 1983

17

Electron energy loss spectriscopy in glancing reflection from bulk crystals

O.L. Krivanek, Y. Tanishiro, K. Takayanagi, K. Yagi

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 854 KB

english, 1983

18

Final discussion session

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 98 KB

english, 1983

19

Photo-electron emission microscopy of work function changes

H. Bethge, M. Klaua

Journal:

Ultramicroscopy

Year:

1983

Language:

english

File:

PDF, 838 KB

english, 1983