Volume 151

Ultramicroscopy

Volume 151

1

Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions

Yang, Hao, Pennycook, Timothy J., Nellist, Peter D.

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 3.86 MB

english, 2015

2

Numerical correction of anti-symmetric aberrations in single HRTEM images of weakly scattering 2D-objects

Lehtinen, Ossi, Geiger, Dorin, Lee, Zhongbo, Whitwick, Michael Brian, Chen, Ming-Wei, Kis, Andras, Kaiser, Ute

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 1.78 MB

english, 2015

3

Large-angle illumination STEM: Toward three-dimensional atom-by-atom imaging

Ishikawa, Ryo, Lupini, Andrew R., Hinuma, Yoyo, Pennycook, Stephen J.

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 4.54 MB

english, 2015

4

Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip

Houdellier, F., de Knoop, L., Gatel, C., Masseboeuf, A., Mamishin, S., Taniguchi, Y., Delmas, M., Monthioux, M., Hÿtch, M.J., Snoeck, E.

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 5.27 MB

english, 2015

5

The influence of Cs/Cc correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy

Zaluzec, Nestor J.

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 2.49 MB

english, 2015

6

Analysis of grain boundary dynamics using event detection and cumulative averaging

Gautam, A., Ophus, C., Lançon, F., Denes, P., Dahmen, U.

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 5.29 MB

english, 2015

7

Environmental transmission electron microscopy for catalyst materials using a spherical aberration corrector

Takeda, Seiji, Kuwauchi, Yasufumi, Yoshida, Hideto

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 10.15 MB

english, 2015

8

A flexible multi-stimuli in situ (S)TEM: Concept, optical performance, and outlook

Börrnert, Felix, Müller, Heiko, Riedel, Thomas, Linck, Martin, Kirkland, Angus I., Haider, Max., Büchner, Bernd, Lichte, Hannes

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 1.39 MB

english, 2015

9

Calculation of inelastic scattering processes of relativistic electrons in oriented crystals

Hinderks, Dieter, Kohl, Helmut

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 492 KB

english, 2015

10

In quest of perfection in electron optics: A biographical sketch of Harald Rose on the occasion of his 80th birthday

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 1.15 MB

english, 2015

11

A nonlinear filtering algorithm for denoising HR(S)TEM micrographs

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 5.45 MB

english, 2015

12

Modelling the inelastic scattering of fast electrons

Allen, L.J., D׳Alfonso, A.J., Findlay, S.D.

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 4.34 MB

english, 2015

13

Optimal experimental design for nano-particle atom-counting from high-resolution STEM images

De Backer, A., De wael, A., Gonnissen, J., Van Aert, S.

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 2.21 MB

english, 2015

14

On the quantitativeness of EDS STEM

Lugg, N.R., Kothleitner, G., Shibata, N., Ikuhara, Y.

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 2.73 MB

english, 2015

15

Catadioptric aberration correction in cathode lens microscopy

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 2.07 MB

english, 2015

16

Semiclassical TEM image formation in phase space

Lubk, Axel, Röder, Falk

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 2.31 MB

english, 2015

17

Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

Pennycook, Timothy J., Lupini, Andrew R., Yang, Hao, Murfitt, Matthew F., Jones, Lewys, Nellist, Peter D.

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 2.67 MB

english, 2015

18

Thermal magnetic field noise: Electron optics and decoherence

Uhlemann, Stephan, Müller, Heiko, Zach, Joachim, Haider, Max.

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 2.28 MB

english, 2015

19

Depth-resolution imaging of crystalline nanoclusters attached on and embedded in amorphous films using aberration-corrected TEM

Yamasaki, Jun, Mori, Masayuki, Hirata, Akihiko, Hirotsu, Yoshihiko, Tanaka, Nobuo

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 3.81 MB

english, 2015

20

Observation of lens aberrations for high resolution electron microscopy II: Simple expressions for optimal estimates

Saxton, W. Owen

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 590 KB

english, 2015

21

Introduction to a Special Issue on Frontiers of Aberration Corrected Electron Microscopy dedicated to Harald Rose on the occasion of his 80th Birthday

Dunin-Borkowski, Rafal E., Mayer, Joachim, Tillmann, Karsten

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 178 KB

english, 2015

22

The role of symmetry in the theory of inelastic high-energy electron scattering and its application to atomic-resolution core-loss imaging

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 754 KB

english, 2015

23

Prospects for versatile phase manipulation in the TEM: Beyond aberration correction

Guzzinati, Giulio, Clark, Laura, Béché, Armand, Juchtmans, Roeland, Van Boxem, Ruben, Mazilu, Michael, Verbeeck, Jo

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 2.37 MB

english, 2015

24

Towards weighing individual atoms by high-angle scattering of electrons

Argentero, G., Mangler, C., Kotakoski, J., Eder, F.R., Meyer, J.C.

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 3.11 MB

english, 2015

25

Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting

De Backer, A., Martinez, G.T., MacArthur, K.E., Jones, L., Béché, A., Nellist, P.D., Van Aert, S.

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 754 KB

english, 2015

26

Optimising electron holography in the presence of partial coherence and instrument instabilities

Chang, Shery L.Y., Dwyer, Christian, Boothroyd, Chris B., Dunin-Borkowski, Rafal E.

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 1.07 MB

english, 2015

27

Multislice algorithms revisited: Solving the Schrödinger equation numerically for imaging with electrons

Wacker, C., Schröder, R.R.

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 1.94 MB

english, 2015

28

Stimulated excitation electron microscopy and spectroscopy

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 655 KB

english, 2015

29

IFC (Editorial Board)

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 79 KB

english, 2015

30

In situ atomic scale mechanical microscopy discovering the atomistic mechanisms of plasticity in nano-single crystals and grain rotation in polycrystalline metals

Han, Xiaodong, Wang, Lihua, Yue, Yonghai, Zhang, Ze

Journal:

Ultramicroscopy

Year:

2015

Language:

english

File:

PDF, 4.50 MB

english, 2015