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Volume 151
Main
Ultramicroscopy
Volume 151
Ultramicroscopy
Volume 151
1
Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions
Yang, Hao
,
Pennycook, Timothy J.
,
Nellist, Peter D.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 3.86 MB
Your tags:
english, 2015
2
Numerical correction of anti-symmetric aberrations in single HRTEM images of weakly scattering 2D-objects
Lehtinen, Ossi
,
Geiger, Dorin
,
Lee, Zhongbo
,
Whitwick, Michael Brian
,
Chen, Ming-Wei
,
Kis, Andras
,
Kaiser, Ute
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 1.78 MB
Your tags:
english, 2015
3
Large-angle illumination STEM: Toward three-dimensional atom-by-atom imaging
Ishikawa, Ryo
,
Lupini, Andrew R.
,
Hinuma, Yoyo
,
Pennycook, Stephen J.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 4.54 MB
Your tags:
english, 2015
4
Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip
Houdellier, F.
,
de Knoop, L.
,
Gatel, C.
,
Masseboeuf, A.
,
Mamishin, S.
,
Taniguchi, Y.
,
Delmas, M.
,
Monthioux, M.
,
Hÿtch, M.J.
,
Snoeck, E.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 5.27 MB
Your tags:
english, 2015
5
The influence of Cs/Cc correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy
Zaluzec, Nestor J.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 2.49 MB
Your tags:
english, 2015
6
Analysis of grain boundary dynamics using event detection and cumulative averaging
Gautam, A.
,
Ophus, C.
,
Lançon, F.
,
Denes, P.
,
Dahmen, U.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 5.29 MB
Your tags:
english, 2015
7
Environmental transmission electron microscopy for catalyst materials using a spherical aberration corrector
Takeda, Seiji
,
Kuwauchi, Yasufumi
,
Yoshida, Hideto
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 10.15 MB
Your tags:
english, 2015
8
A flexible multi-stimuli in situ (S)TEM: Concept, optical performance, and outlook
Börrnert, Felix
,
Müller, Heiko
,
Riedel, Thomas
,
Linck, Martin
,
Kirkland, Angus I.
,
Haider, Max.
,
Büchner, Bernd
,
Lichte, Hannes
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 1.39 MB
Your tags:
english, 2015
9
Calculation of inelastic scattering processes of relativistic electrons in oriented crystals
Hinderks, Dieter
,
Kohl, Helmut
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 492 KB
Your tags:
english, 2015
10
In quest of perfection in electron optics: A biographical sketch of Harald Rose on the occasion of his 80th birthday
Urban, Knut W.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 1.15 MB
Your tags:
english, 2015
11
A nonlinear filtering algorithm for denoising HR(S)TEM micrographs
Du, Hongchu
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 5.45 MB
Your tags:
english, 2015
12
Modelling the inelastic scattering of fast electrons
Allen, L.J.
,
D׳Alfonso, A.J.
,
Findlay, S.D.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 4.34 MB
Your tags:
english, 2015
13
Optimal experimental design for nano-particle atom-counting from high-resolution STEM images
De Backer, A.
,
De wael, A.
,
Gonnissen, J.
,
Van Aert, S.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 2.21 MB
Your tags:
english, 2015
14
On the quantitativeness of EDS STEM
Lugg, N.R.
,
Kothleitner, G.
,
Shibata, N.
,
Ikuhara, Y.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 2.73 MB
Your tags:
english, 2015
15
Catadioptric aberration correction in cathode lens microscopy
Tromp, R.M.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 2.07 MB
Your tags:
english, 2015
16
Semiclassical TEM image formation in phase space
Lubk, Axel
,
Röder, Falk
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 2.31 MB
Your tags:
english, 2015
17
Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution
Pennycook, Timothy J.
,
Lupini, Andrew R.
,
Yang, Hao
,
Murfitt, Matthew F.
,
Jones, Lewys
,
Nellist, Peter D.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 2.67 MB
Your tags:
english, 2015
18
Thermal magnetic field noise: Electron optics and decoherence
Uhlemann, Stephan
,
Müller, Heiko
,
Zach, Joachim
,
Haider, Max.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 2.28 MB
Your tags:
english, 2015
19
Depth-resolution imaging of crystalline nanoclusters attached on and embedded in amorphous films using aberration-corrected TEM
Yamasaki, Jun
,
Mori, Masayuki
,
Hirata, Akihiko
,
Hirotsu, Yoshihiko
,
Tanaka, Nobuo
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 3.81 MB
Your tags:
english, 2015
20
Observation of lens aberrations for high resolution electron microscopy II: Simple expressions for optimal estimates
Saxton, W. Owen
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 590 KB
Your tags:
english, 2015
21
Introduction to a Special Issue on Frontiers of Aberration Corrected Electron Microscopy dedicated to Harald Rose on the occasion of his 80th Birthday
Dunin-Borkowski, Rafal E.
,
Mayer, Joachim
,
Tillmann, Karsten
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 178 KB
Your tags:
english, 2015
22
The role of symmetry in the theory of inelastic high-energy electron scattering and its application to atomic-resolution core-loss imaging
Dwyer, C.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 754 KB
Your tags:
english, 2015
23
Prospects for versatile phase manipulation in the TEM: Beyond aberration correction
Guzzinati, Giulio
,
Clark, Laura
,
Béché, Armand
,
Juchtmans, Roeland
,
Van Boxem, Ruben
,
Mazilu, Michael
,
Verbeeck, Jo
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 2.37 MB
Your tags:
english, 2015
24
Towards weighing individual atoms by high-angle scattering of electrons
Argentero, G.
,
Mangler, C.
,
Kotakoski, J.
,
Eder, F.R.
,
Meyer, J.C.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 3.11 MB
Your tags:
english, 2015
25
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting
De Backer, A.
,
Martinez, G.T.
,
MacArthur, K.E.
,
Jones, L.
,
Béché, A.
,
Nellist, P.D.
,
Van Aert, S.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 754 KB
Your tags:
english, 2015
26
Optimising electron holography in the presence of partial coherence and instrument instabilities
Chang, Shery L.Y.
,
Dwyer, Christian
,
Boothroyd, Chris B.
,
Dunin-Borkowski, Rafal E.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 1.07 MB
Your tags:
english, 2015
27
Multislice algorithms revisited: Solving the Schrödinger equation numerically for imaging with electrons
Wacker, C.
,
Schröder, R.R.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 1.94 MB
Your tags:
english, 2015
28
Stimulated excitation electron microscopy and spectroscopy
Howie, A.
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 655 KB
Your tags:
english, 2015
29
IFC (Editorial Board)
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 79 KB
Your tags:
english, 2015
30
In situ atomic scale mechanical microscopy discovering the atomistic mechanisms of plasticity in nano-single crystals and grain rotation in polycrystalline metals
Han, Xiaodong
,
Wang, Lihua
,
Yue, Yonghai
,
Zhang, Ze
Journal:
Ultramicroscopy
Year:
2015
Language:
english
File:
PDF, 4.50 MB
Your tags:
english, 2015
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