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Volume 161
Main
Ultramicroscopy
Volume 161
Ultramicroscopy
Volume 161
1
Direct in situ thermometry: Variations in reciprocal-lattice vectors and challenges with the Debye–Waller effect
Cremons, Daniel R.
,
Flannigan, David J.
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 1.71 MB
Your tags:
english, 2016
2
Characterizing the response of a scintillator-based detector to single electrons
Sang, Xiahan
,
LeBeau, James M.
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 4.74 MB
Your tags:
english, 2016
3
Quantitative assessment of contact and non-contact lateral force calibration methods for atomic force microscopy
Tran Khac, Bien Cuong
,
Chung, Koo-Hyun
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 3.37 MB
Your tags:
english, 2016
4
Spherical aberration correction with threefold symmetric line currents
Hoque, Shahedul
,
Ito, Hiroyuki
,
Nishi, Ryuji
,
Takaoka, Akio
,
Munro, Eric
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 1.10 MB
Your tags:
english, 2016
5
GHz laser-free time-resolved transmission electron microscopy: A stroboscopic high-duty-cycle method
Qiu, Jiaqi
,
Ha, Gwanghui
,
Jing, Chunguang
,
Baryshev, Sergey V.
,
Reed, Bryan W.
,
Lau, June W.
,
Zhu, Yimei
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 773 KB
Your tags:
english, 2016
6
Annular dark field transmission electron microscopy for protein structure determination
Koeck, Philip J.B.
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 4.42 MB
Your tags:
english, 2016
7
Orientation mapping by transmission-SEM with an on-axis detector
Fundenberger, J.J.
,
Bouzy, E.
,
Goran, D.
,
Guyon, J.
,
Yuan, H.
,
Morawiec, A.
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 4.25 MB
Your tags:
english, 2016
8
Advancing FIB assisted 3D EBSD using a static sample setup
Guyon, Julien
,
Gey, Nathalie
,
Goran, Daniel
,
Chalal, Smail
,
Pérez-Willard, Fabián
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 3.07 MB
Your tags:
english, 2016
9
Large volume serial section tomography by Xe Plasma FIB dual beam microscopy
Burnett, T.L.
,
Kelley, R.
,
Winiarski, B.
,
Contreras, L.
,
Daly, M.
,
Gholinia, A.
,
Burke, M.G.
,
Withers, P.J.
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 9.32 MB
Your tags:
english, 2016
10
Measurement of the permittivity and loss of high-loss materials using a Near-Field Scanning Microwave Microscope
Gregory, A.P.
,
Blackburn, J.F.
,
Lees, K.
,
Clarke, R.N.
,
Hodgetts, T.E.
,
Hanham, S.M.
,
Klein, N.
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 694 KB
Your tags:
english, 2016
11
Outwitting the series resistance in scanning spreading resistance microscopy
Schulze, A.
,
Cao, R.
,
Eyben, P.
,
Hantschel, T.
,
Vandervorst, W.
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 1004 KB
Your tags:
english, 2016
12
Realization of a tilted reference wave for electron holography by means of a condenser biprism
Röder, Falk
,
Houdellier, Florent
,
Denneulin, Thibaud
,
Snoeck, Etienne
,
Hÿtch, Martin
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 5.38 MB
Your tags:
english, 2016
13
The Ettention software package
Dahmen, Tim
,
Marsalek, Lukas
,
Marniok, Nico
,
Turoňová, Beata
,
Bogachev, Sviatoslav
,
Trampert, Patrick
,
Nickels, Stefan
,
Slusallek, Philipp
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 3.56 MB
Your tags:
english, 2016
14
Dopant profiling based on scanning electron and helium ion microscopy
Chee, Augustus K.W.
,
Boden, Stuart A.
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 6.17 MB
Your tags:
english, 2016
15
Fabrication of tungsten probe for hard tapping operation in atomic force microscopy
Han, Guebum
,
Ahn, Hyo-Sok
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 4.77 MB
Your tags:
english, 2016
16
Segmentation of 3D EBSD data for subgrain boundary identification and feature characterization
Loeb, Andrew
,
Ferry, Michael
,
Bassman, Lori
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 5.29 MB
Your tags:
english, 2016
17
Performance of a direct detection camera for off-axis electron holography
Chang, Shery L.Y.
,
Dwyer, Christian
,
Barthel, Juri
,
Boothroyd, Chris B.
,
Dunin-Borkowski, Rafal E.
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 1.43 MB
Your tags:
english, 2016
18
IFC (Editorial Board)
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 70 KB
Your tags:
english, 2016
19
Cross-sectional atom probe tomography sample preparation for improved analysis of fins on SOI
Martin, Andrew J.
,
Weng, Weihao
,
Zhu, Zhengmao
,
Loesing, Rainer
,
Shaffer, James
,
Katnani, Ahmad
Journal:
Ultramicroscopy
Year:
2016
Language:
english
File:
PDF, 1.63 MB
Your tags:
english, 2016
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