Volume 161

Ultramicroscopy

Volume 161

1

Direct in situ thermometry: Variations in reciprocal-lattice vectors and challenges with the Debye–Waller effect

Cremons, Daniel R., Flannigan, David J.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.71 MB

english, 2016

2

Characterizing the response of a scintillator-based detector to single electrons

Sang, Xiahan, LeBeau, James M.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 4.74 MB

english, 2016

3

Quantitative assessment of contact and non-contact lateral force calibration methods for atomic force microscopy

Tran Khac, Bien Cuong, Chung, Koo-Hyun

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 3.37 MB

english, 2016

4

Spherical aberration correction with threefold symmetric line currents

Hoque, Shahedul, Ito, Hiroyuki, Nishi, Ryuji, Takaoka, Akio, Munro, Eric

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.10 MB

english, 2016

5

GHz laser-free time-resolved transmission electron microscopy: A stroboscopic high-duty-cycle method

Qiu, Jiaqi, Ha, Gwanghui, Jing, Chunguang, Baryshev, Sergey V., Reed, Bryan W., Lau, June W., Zhu, Yimei

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 773 KB

english, 2016

6

Annular dark field transmission electron microscopy for protein structure determination

Koeck, Philip J.B.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 4.42 MB

english, 2016

7

Orientation mapping by transmission-SEM with an on-axis detector

Fundenberger, J.J., Bouzy, E., Goran, D., Guyon, J., Yuan, H., Morawiec, A.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 4.25 MB

english, 2016

8

Advancing FIB assisted 3D EBSD using a static sample setup

Guyon, Julien, Gey, Nathalie, Goran, Daniel, Chalal, Smail, Pérez-Willard, Fabián

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 3.07 MB

english, 2016

9

Large volume serial section tomography by Xe Plasma FIB dual beam microscopy

Burnett, T.L., Kelley, R., Winiarski, B., Contreras, L., Daly, M., Gholinia, A., Burke, M.G., Withers, P.J.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 9.32 MB

english, 2016

10

Measurement of the permittivity and loss of high-loss materials using a Near-Field Scanning Microwave Microscope

Gregory, A.P., Blackburn, J.F., Lees, K., Clarke, R.N., Hodgetts, T.E., Hanham, S.M., Klein, N.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 694 KB

english, 2016

11

Outwitting the series resistance in scanning spreading resistance microscopy

Schulze, A., Cao, R., Eyben, P., Hantschel, T., Vandervorst, W.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1004 KB

english, 2016

12

Realization of a tilted reference wave for electron holography by means of a condenser biprism

Röder, Falk, Houdellier, Florent, Denneulin, Thibaud, Snoeck, Etienne, Hÿtch, Martin

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 5.38 MB

english, 2016

13

The Ettention software package

Dahmen, Tim, Marsalek, Lukas, Marniok, Nico, Turoňová, Beata, Bogachev, Sviatoslav, Trampert, Patrick, Nickels, Stefan, Slusallek, Philipp

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 3.56 MB

english, 2016

14

Dopant profiling based on scanning electron and helium ion microscopy

Chee, Augustus K.W., Boden, Stuart A.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 6.17 MB

english, 2016

15

Fabrication of tungsten probe for hard tapping operation in atomic force microscopy

Han, Guebum, Ahn, Hyo-Sok

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 4.77 MB

english, 2016

16

Segmentation of 3D EBSD data for subgrain boundary identification and feature characterization

Loeb, Andrew, Ferry, Michael, Bassman, Lori

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 5.29 MB

english, 2016

17

Performance of a direct detection camera for off-axis electron holography

Chang, Shery L.Y., Dwyer, Christian, Barthel, Juri, Boothroyd, Chris B., Dunin-Borkowski, Rafal E.

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.43 MB

english, 2016

18

IFC (Editorial Board)

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 70 KB

english, 2016

19

Cross-sectional atom probe tomography sample preparation for improved analysis of fins on SOI

Martin, Andrew J., Weng, Weihao, Zhu, Zhengmao, Loesing, Rainer, Shaffer, James, Katnani, Ahmad

Journal:

Ultramicroscopy

Year:

2016

Language:

english

File:

PDF, 1.63 MB

english, 2016