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Volume 187
Main
Ultramicroscopy
Volume 187
Ultramicroscopy
Volume 187
1
Monte Carlo simulation and theoretical calculation of SEM image intensity and its application in thickness measurement
Tian, Jinsen
,
Wu, Jing
,
Chiu, Yu-Lung
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 2.40 MB
Your tags:
english, 2018
2
Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy
Martinez, G.T.
,
van den Bos, K.H.W.
,
Alania, M.
,
Nellist, P.D.
,
Van Aert, S.
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 2.70 MB
Your tags:
english, 2018
3
Charge dynamics in aluminum oxide thin film studied by ultrafast scanning electron microscopy
Zani, Maurizio
,
Sala, Vittorio
,
Irde, Gabriele
,
Pietralunga, Silvia Maria
,
Manzoni, Cristian
,
Cerullo, Giulio
,
Lanzani, Guglielmo
,
Tagliaferri, Alberto
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 976 KB
Your tags:
english, 2018
4
Quantification of nanomechanical properties of surfaces by higher harmonic monitoring in amplitude modulated AFM imaging
Gramazio, Federico
,
Lorenzoni, Matteo
,
Pérez-Murano, Francesc
,
Evangelio, Laura
,
Fraxedas, Jordi
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 1.79 MB
Your tags:
english, 2018
5
Image feature delocalization in defocused probe electron ptychography
Cao, S.
,
Maiden, A.M.
,
Rodenburg, J.M.
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 6.14 MB
Your tags:
english, 2018
6
Theory of the spatial resolution of (scanning) transmission electron microscopy in liquid water or ice layers
de Jonge, Niels
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 1017 KB
Your tags:
english, 2018
7
Local low rank denoising for enhanced atomic resolution imaging
Spiegelberg, Jakob
,
Idrobo, Juan Carlos
,
Herklotz, Andreas
,
Ward, Thomas Zac
,
Zhou, Wu
,
Rusz, Ján
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 3.85 MB
Your tags:
english, 2018
8
Charge accumulation in electron cryomicroscopy
Russo, Christopher J.
,
Henderson, Richard
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 2.79 MB
Your tags:
english, 2018
9
Microscopic charge fluctuations cause minimal contrast loss in cryoEM
Russo, Christopher J.
,
Henderson, Richard
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 4.21 MB
Your tags:
english, 2018
10
“One-sample concept” micro-combinatory for high throughput TEM of binary films
Sáfrán, György
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 1.74 MB
Your tags:
english, 2018
11
Design of an electrostatic phase shifting device for biological transmission electron microscopy
Koeck, Philip J.B.
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 831 KB
Your tags:
english, 2018
12
Spherical aberration correction with an in-lens N -fold symmetric line currents model
Hoque, Shahedul
,
Ito, Hiroyuki
,
Nishi, Ryuji
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 1.75 MB
Your tags:
english, 2018
13
Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscope
Pascal, Elena
,
Singh, Saransh
,
Callahan, Patrick G.
,
Hourahine, Ben
,
Trager-Cowan, Carol
,
Graef, Marc De
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 2.62 MB
Your tags:
english, 2018
14
Editorial Board
Journal:
Ultramicroscopy
Year:
2018
File:
PDF, 26 KB
Your tags:
2018
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