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Volume 193
Main
Ultramicroscopy
Volume 193
Ultramicroscopy
Volume 193
1
On the quantitativeness of grain boundary chemistry using STEM EDS: A ZrO 2 Σ9 model grain boundary case study
Feng, B.
,
Lugg, N.R.
,
Kumamoto, A.
,
Shibata, N.
,
Ikuhara, Y.
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 1.76 MB
Your tags:
english, 2018
2
Towards bend-contour-free dislocation imaging via diffraction contrast STEM
Zhu, Yuanyuan
,
Ophus, Colin
,
Toloczko, Mychailo B.
,
Edwards, Danny J.
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 6.48 MB
Your tags:
english, 2018
3
Impact of the electron beam on the thermal stability of gold nanorods studied by environmental transmission electron microscopy
Albrecht, Wiebke
,
van de Glind, Arjen
,
Yoshida, Hideto
,
Isozaki, Yusuke
,
Imhof, Arnout
,
van Blaaderen, Alfons
,
de Jongh, Petra E.
,
de Jong, Krijn P.
,
Zečević, Jovana
,
Takeda, Seiji
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 1.90 MB
Your tags:
english, 2018
4
Thermal nanometrology using piezoresistive SThM probes with metallic tips
Janus, Paweł
,
Sierakowski, Andrzej
,
Rudek, Maciej
,
Kunicki, Piotr
,
Dzierka, Andrzej
,
Biczysko, Paweł
,
Gotszalk, Teodor
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 2.08 MB
Your tags:
english, 2018
5
Resolution of transmission electron backscatter diffraction in aluminum and silver: Effect of the atomic number
Kuo, Chia-Wei
,
Kuo, Jui-Chao
,
Wang, Sheng-Chang
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 2.79 MB
Your tags:
english, 2018
6
New approach in Auger elemental relative sensitive factor calculation by using TEM-EDS analysis based on bi-layers of pure elements
Mello, D.
,
Nacucchi, M.
,
Anastasi, G.
,
Sacchi, M.
,
Ricciari, R.
,
Burresi, E.
,
Tapfer, L.
Journal:
Ultramicroscopy
Year:
2018
Language:
english
File:
PDF, 1.78 MB
Your tags:
english, 2018
7
Editorial Board
Journal:
Ultramicroscopy
Year:
2018
File:
PDF, 34 KB
Your tags:
2018
1
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